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Conferences

Extreme Expressions of DNA Repair Proteins APE1 and MTH1, in Human Breast Cancer as Measured by Liquid Chromatography and Isotope Dilution Tandem Mass Spectrometry

Author(s)
Erdem Coskun, Pawel Jaruga, Leona D. Scanlan, Alessandro Tona, Mark S. Lowenthal, Prasad T. Reddy, M Miral Dizdar, Ann-Sofie Jemth, Olga Loseva, Thomas Helleday
Accurate measurement of DNA repair proteins in cancer tissues is becoming more important due to the individual and origin based expression differences in cancer

Predictive Models for Min-Entropy Estimation

Author(s)
John M. Kelsey, Kerry McKay, Meltem Sonmez Turan
Random numbers are essential for cryptography. In most real-world systems, these values come from a cryptographic pseudorandom number generator (PRNG), which in

NIST Language Recognition Evaluation – Plans For 2015

Author(s)
Alvin F. Martin, Craig S. Greenberg, John M. Howard, Desire Banse, G R. Doddington, Jaime Hernandez-Cordero, Lisa Mason
We discuss two NIST coordinated evaluations of automatic language recognition technology planned for calendar year 2015 along with possible additional plans for

Analysis of the Second Phase of the 2013-2014 i-Vector Machine Learning Challenge

Author(s)
Desire Banse, G R. Doddington, Craig Greenberg, John M. Howard, Alvin F. Martin, Daniel Garcia-Romero, John J. Godfrey, Jaime Hernandez-Cordero, Lisa Mason, Alan McCree, Douglas A. Reynolds
In late 2013 and 2014, the National Institute of Standards and Technology (NIST) coordinated an i-vector challenge utilizing data from previous NIST Speaker

Standardization of UV LED measurements

Author(s)
George P. Eppeldauer, Thomas C. Larason, Howard W. Yoon
Traditionally used source spectral-distribution or detector spectral-response based standards cannot be applied for accurate UV LED measurements. Since the CIE

Voltage Metrology Using a Quantum AC Standard

Author(s)
Thomas E. Lipe, Joseph R. Kinard Jr., Yi-hua Tang, Samuel P. Benz, Charles J. Burroughs, Paul D. Dresselhaus
We report on the use of a quantum-based AC voltage standard for ac-dc difference metrology at the National Institute of Standards and Technology (NIST). The

Modest proposals for improving biometric recognition papers

Author(s)
James R. Matey, George W. Quinn, Patrick J. Grother, Elham Tabassi, Craig I. Watson, James L. Wayman
We present practical recommendations for improving the clarity, transparency, and usefulness of many biometric papers. Several of the recommendations can be
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