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Conferences

Characterizing the thermal effects of High Energy Arc Faults

Author(s)
Anthony D. Putorti Jr., Nicholas Melly, Scott Bareham, Joseph E. Praydis
International and domestic operating experience involving High Energy Arc Faults (HEAF) in Nuclear Power Plant (NPP) electrical power systems have demonstrated...

Quantized Hall resistance in large-scale monolayer graphene

Author(s)
Yanfei Yang, Chiashain Chuang, Chieh W. Liu, Randolph Elmquist
Abstract: Graphene is an atomic-thickness carbon lattice that can be exfoliated from solid graphite or grown using high temperature processing methods on a...

On the Internet Connectivity in Africa

Author(s)
Assane Gueye, Peter Mell, Desire Banse, Faical Y. Congo
This study measures and documents growth of Internet connectivity in Africa from 2010 to 2014 with a focus on inter-country relationships. We evaluate both...

Minimizing Attack Graph Data Structures

Author(s)
Peter Mell, Richard Harang
An attack graph is a data structure representing how an attacker can chain together multiple attacks to expand their influence within a network (often in an...

The Occurrence of Repeated Fiber Breaks in Microcomposites

Author(s)
Gale A. Holmes, Edward D. McCarthy, Nathanael A. Heckert, Stefan D. Leigh, Jae Hyun Kim, Jeffrey W. Gilman
The mechanical integrity of a structural composite is strongly affected by the strength and toughness of the fiber–matrix interface/interphase (Norwood, 1994)...

Performance evaluation of a laser tracker hand held touch probe

Author(s)
Bala Muralikrishnan, Christopher J. Blackburn, Prem K. Rachakonda, Daniel S. Sawyer
Hand-held touch probes and laser scanners are increasing the scope and applicability of laser trackers. While methods to evaluate the performance of laser...

Photomask Linewidth Comparison by PTB and NIST

Author(s)
Detleff Bergmann, Bernd Bodermann, Harald Bosse, Egbert Buhr, Gaoliang Dai, Ronald G. Dixson, W H?er-Grohne
We report the initial results of a recent bilateral comparison of linewidth or critical dimension (CD) calibrations on photo-mask line features between two...

A Neural Network Meta-Model and its Application for Manufacturing

Author(s)
David J. Lechevalier, Ronay Ak, Steven Hudak, Yung-Tsun T. Lee, Sebti Foufou
Manufacturing generates a vast amount of data both from operations and simulation. Extracting appropriate information from this data can provide insights to...

Automated uncertainty quantification analysis using system model and data

Author(s)
Saideep Nannapaneni, Sankaran Mahadevan, David Lechevalier, Anantha Narayanan Narayanan, Sudarsan Rachuri
Understanding the sources of, and quantifying the magnitude of, uncertainty can improve decision-making and, thereby, make manufacturing systems more efficient...
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