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NIST on a Chip: Realizing SI units with microfabricated alkali vapour cells
Published
Author(s)
John E. Kitching, Elizabeth A. Donley, Svenja A. Knappe, Matthew T. Hummon, Argyrios Dellis, Jeffrey A. Sherman, Kartik A. Srinivasan, Vladimir A. Aksyuk, Qiliang Li, Daron A. Westly, Brian J. Roxworthy, Amit Lal
Abstract
We describe several ways in which microfabricated alkali atom vapour cells might potentially be used to accurately realize a variety of SI units, including the second, the meter, the kelvin, the ampere and the volt, in a compact, low-cost chip-scale package. Such instruments may allow inexpensive in-situ calibrations at the users location or widespread integration of accurate references into instrumentation and systems.
Proceedings Title
Proceedings of the 8th international Conference on Frequency Standards and Metrology
Kitching, J.
, Donley, E.
, Knappe, S.
, Hummon, M.
, Dellis, A.
, Sherman, J.
, Srinivasan, K.
, Aksyuk, V.
, Li, Q.
, Westly, D.
, Roxworthy, B.
and Lal, A.
(2015),
NIST on a Chip: Realizing SI units with microfabricated alkali vapour cells, Proceedings of the 8th international Conference on Frequency Standards and Metrology, Potsdam, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=919803
(Accessed October 10, 2025)