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Conferences

Experimental Demonstration of Some Aspects of LISA Interferometry

July 1, 1998

Author(s)

R T. Giaime, R T. Stebbins, P L. Bender, J E. Faller, J L. Hall

Plans are described to experimentally demonstrate at JILA a possible phase measurement technique for use in LISA interferometry. This demonstration will include...

Quantitative Surface Analysis for Catalysts by Electron Spectroscopy

July 1, 1998

Author(s)

H Shimada, Cedric J. Powell

An overview is given of a new cooperative project under the Implementing Agreement between the Technology Administration, U.S. Department of Commerce, and the...

Comparison of Measured and Modeled Scanning Capacitance Microscopy Images Across P-N Junctions

July 1, 1998

Author(s)

Joseph Kopanski, Jay F. Marchiando, John Albers, Brian G. Rennex

Scanning capacitance microscope (SCM) image contrast measured on ion implanted P +/P and P +/N junction structures with identical dopant profiles, as a function...

Characterization of Thin SiO₂ on Si by Spectroscopic Ellipsometry, Neutron Reflectometry, and X-Ray Reflectometry

July 1, 1998

Author(s)

Curt A. Richter, Nhan Van Nguyen, Joseph Dura, Charles Majkrzak

We compare the results of neutron reflectometry, x-ray reflectometry, and spectroscopic ellipsometry measurements of a thin oxide film (=10 nm). These methods...

Uncertainty Analysis of Josephson Voltage Standard System and Inter-Laboratory Comparison Experiment

July 1, 1998

Author(s)

Richard L. Steiner, Yi-hua D. Tang, June E. Sims, Alan F. Clark

High precision voltage calibrations are now regularly performed in industrial calibration laboratories with Josephson array voltage standard systems. A full...

Culture Conflicts in Software Engineering Technology Transfer

June 30, 1998

Author(s)

M V. Zelkowitz, D Wallace, D W. Binkley

Although the need to transition new technology to improve the process of developing quality software products is well understood, the computer software industry...

Infrared Diffuse Reflectance Instrumentation and Standards at NIST

June 29, 1998

Author(s)

Leonard M. Hanssen, Simon G. Kaplan

A spectrophotometer system for spectral characterization of materials in the infrared has been built around a bench-top Fourier transform (FTIR) instrument. Its...

Issues in Evaluating Face Recognition Algorithms

June 22, 1998

Author(s)

P J. Phillips, R. McCabe, R Chellappa

Biometric-based identification and verification systems are poised to become a key technology, with applications including controlling access to buildings and...

Towards Full Field Scaling of the Centerline Behavior for Initially Turbulent Axisymmetric Jets

June 21, 1998

Author(s)

G, Papadopoulos, William M. Pitts

Recently the authors introduced a length scale for effectively collapsing the near field centerline velocity and mass fraction of constant and variable density...

Insights From the Broadcast News Benchmark Tests

June 8, 1998

Author(s)

Walter S. Liggett Jr, W M. Fisher

The broadcast news benchmark tests have potential as a source of ideas for improving continuous speech recognition systems. This paper presents a data analysis...

Building and Fire Research Laboratory Publications, 1991.

June 7, 1998

Author(s)

Barbara C. Lippiatt

The BEES (Building for Environmental and Economic Sustainability) software implements a rational, systematic technique for balancing the environmental and...

Plastic Flip-Chip-BGA Carrier With Microvias for Chip Scale Packaging

June 2, 1998

Author(s)

Jan Obrzut, M Jimarez

We evaluated a near-chip-scale package, that utilizes the flip-chip, plastic-ball-grid-array technology with microvias. The microvias were photolithographically...

Characterization of On-Wafer Diode Noise Sources

June 1, 1998

Author(s)

James P. Randa, Dave K. Walker, Lawrence P. Dunleavy, Robert L. Billinger, John Rice

A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National...

Accuracy of Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers

June 1, 1998

Author(s)

Roger Marks, Jeffrey A. Jargon, D. K. Rytting

Several lumped-element calibrations have been proposed for four-sampler vector network analyzers. This paper offers the first assessment of their accuracy in...

Development of a Molecular Dynamics Model of Thermal Reactivity in Polymers

June 1, 1998

Author(s)

Marc R. Nyden

Thermal reactivity is an important consideration that impacts the way polymers and the materials that are made from them are processed and used. This...

The Performance of Transit Time Flowmeters in Heated Gas Mixtures

June 1, 1998

Author(s)

John D. Wright

An ultrasonic transit time flowmeter was tested over Reynolds numbers from 1000 to 100,000 in a calibration facility that generates gas flows with controlled...

Determination of Hydrogen in Metals, Semiconductors, and Other Materials by Cold Neutron Prompt Gamma-Ray Activation Analysis

June 1, 1998

Author(s)

Rick L. Paul, Richard M. Lindstrom

Performance of Tape-Bonded Seams of EPDM Membranes: Factors Affecting the Creep-Rupture Response of Tape-Bonded and Liquid-Adhesive-Bonded Seams

June 1, 1998

Author(s)

Walter J. Rossiter Jr, M Vangel, K M. Kraft

A field investigation of tape-bonded seams of EPDM (ethylene propylene diene terpolymer) roof membranes is described. Since the early 1990s the use of tape...

Comparison of SOLR and TRL Calibrations

June 1, 1998

Author(s)

Dave K. Walker, Dylan F. Williams

We examine a short-open-load-reciprocal scattering parameter calibration in both in-line and orthogonal probe configurations. We explore its standard...

In-Line Multiport Calibration Algorithm

June 1, 1998

Author(s)

Dylan F. Williams, Dave K. Walker

We present a multiport measurement procedure well suited to on-wafer measurement. It can correct multiport measurements with any conventional in-line...

A Cryogenic Catheter for Treating Heart Arrhythmia

June 1, 1998

Author(s)

E D. Marquardt, Ray Radebaugh, J Dobak

Progress in the development of a cryogenic catheter to treat heart arrhythmia is discussed. This system uses a mixed-gas Joule-Thomson refrigerator to cool the...

Metrology: Impact on National Economy and International Trade

June 1, 1998

Author(s)

Hratch G. Semerjian, Robert L. Watters

The U.S. Federal Government has a strong role in metrology R&D in the U.S because of its importance to the nation's economy and the Constitutional authority...

Lumped-Element Impedance Standards

June 1, 1998

Author(s)

Dylan F. Williams, Dave K. Walker

We measure the electrical parameters of commercial lumped-element impedance standards manufactured for the calibration of on-wafer probing systems. The standard...

Accurate Characteristic Impedance Measurement on Silicon

June 1, 1998

Author(s)

Dylan F. Williams, Uwe Arz, Hartmut Grabinski

This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when...

Metal-Insulator-Semiconductor Transmission Line Model

June 1, 1998

Author(s)

Dylan F. Williams

This paper investigates the one-dimensional metal-insulator-semiconductor transmission line. It develops closed-form expressions for equivalent-circuit...

Optical computer aided tomography for plasma uniformity measurements

June 1, 1998

Author(s)

Eric C. Benck, J R. Roberts

Developing Usability Tools and Techniques for Designing and Testing Web Sites

June 1, 1998

Author(s)

Jean C. Scholtz, Sharon J. Laskowski, L L. Downey

Web sites are developed by a wide variety of companies from small one or two person operations to large corportions with entire teams and departments devoted to...

VRML Test Case Generation and Evaluation Using Java

June 1, 1998

Author(s)

Leonard E. Gebase, Mary C. Brady, Alden A. Dima, Lynne S. Rosenthal

A well-established approach to conformance testing is to treat the implementation being tested as a black box. With this approach, a reference implementation is...

Cyclopolymerizable Monomers for Use as Acrylic Biomaterials

June 1, 1998

Author(s)

John A. Tesk, J W. Stansbury, Alan S. Litsky

Despite their many advantageous characteristics and extensive use, mixtures of methyl methacrylate monomers (MMA) and poly methyl methacrylate powders have some...

X-Ray Transition Energies -- New Comprehensive Evaluation

June 1, 1998

Author(s)

R Deslattes, Ernest G. Kessler, Paul Indelicato, E Lindroth

In this brief report we describe some of the background for our continuing efforts toward a new comprehensive data base for x-ray transitions, and indicate the...

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