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Conferences

Lumped-Element Impedance Standards

Author(s)
Dylan F. Williams, Dave K. Walker
We measure the electrical parameters of commercial lumped-element impedance standards manufactured for the calibration of on-wafer probing systems. The standard

VRML Test Case Generation and Evaluation Using Java

Author(s)
Leonard E. Gebase, Mary C. Brady, Alden A. Dima, Lynne S. Rosenthal
A well-established approach to conformance testing is to treat the implementation being tested as a black box. With this approach, a reference implementation is

X-Ray Transition Energies -- New Comprehensive Evaluation

Author(s)
R Deslattes, Ernest G. Kessler, Paul Indelicato, E Lindroth
In this brief report we describe some of the background for our continuing efforts toward a new comprehensive data base for x-ray transitions, and indicate the

Toward a Unified Advanced CD-SEM Specification for Sub 0.18 Micrometer Technology

Author(s)
J Allgair, C Archie, W Banke, H Bogardus, J Griffith, H Marchman, Michael T. Postek, L Saraf, J Schlesinger, B Singh, N. Sullivan, L Trimble, Andras Vladar, A Yanof
The stringent critical dimension (CD) control requirements in cutting edge device facilities have placed significant demands on metrologists and upon the tools

Optimizing GMR Spin Valves: The Outlook for Improved Properties

Author(s)
William F. Egelhoff Jr., P J. Chen, Cedric J. Powell, D Parks, Robert McMichael, J Judy, D Martien, A. E. Berkowitz, J M. Daughton
The current generation of giant magnetoresistance (GMR) spin valves exhibits performance characteristics which are not quite as good as desired for ultrahigh

Stability of Multilayer Structures: Capillary Effects

Author(s)
Daniel Josell, W Carter, John E. Bonevich
The long term stability of multilayer materials composed of nonreactive, immiscible materials is related to the equilibrium shapes of the individual grains

Quality Control Procedures for the NIST/EPA/NIH Mass Spectral Library

Author(s)
C L. Clifton, S G. Lias, Anzor I. Mikaia, O D. Sparkman, Stephen Stein, Dmitrii Tchekhovskoi, Damo Zhu, Vladimir G. Zaikin
The goal of quality control procedures is to produce the best possible spectra for library searching. The role of a panel of data evaluators is presented, and

Software Testing: Protocol Comparison

Author(s)
James H. Yen, D L. Banks, Leonard J. Gallagher, Paul E. Black, Robert C. Hagwood, Raghu N. Kacker, Lynne S. Rosenthal
Software testing is hard, expensive, and uncertain. Many protocols have been suggested, especially in the area of conformance verification. In order to compare
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