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Conferences

Cure, Shrinkage and Properties of an Epoxy Material

Author(s)
O Sindt, S L. Simon, G B. McKenna, E Liang
This work focuses on obtaining data to perform realistic finite element models of residual stresses in composite parts made of toughened epoxy thermosets. The

Advanced MMI/MP for Demo III XUVs

Author(s)
Stephen B. Balakirsky, M J. Salonish, S D. Allen, Elena R. Messina, J Salinas
This paper outlines the goals and work accomplished thus far for both the man-machine interface (MMI) and mission planning (MP) elements of the eXperimental

Anisotropic Microstructure of Plasma-Sprayed Deposits

Author(s)
J Ilavsky, Gabrielle G. Long, Andrew J. Allen, L Leblanc, M Prystay, C Moreau, Alan H. Band
The microstructure of plasma-sprayed deposits [PSD] is dominated by two void systems-interlamellar pores and intralamellar cracks - each with a different

Critical Compilation of Atomic Wavelength and Energy Level Data

Author(s)
William C. Martin, J Sugar, Arlene Musgrove, Craig J. Sansonetti, Jean E. Sansonetti, Edward B. Saloman, V I. Azarov, Alexander Kramida, A N. Ryabtsev, T Shirai
The Atomic Energy Levels Data Center at the National Institute of Standards and Technology (NIST), in cooperation with other laboratories indicated above, is

RTP Calibration Wafer Using Thin-Film Thermocouples

Author(s)
Kenneth G. Kreider, D P. DeWitt, Benjamin K. Tsai, Francis J. Lovas, David W. Allen
Rapid thermal processing (RTP) is a key technology for the cluster tool, single wafer manufacturing approach that is used to produce integrated circuits at

Network Security Testing Using Mobile Agents

Author(s)
Athanasios T. Karygiannis
This paper describes a prototype security testing tool that is currently under development at NIST. This prototype tool uses autonomous mobile agents to perform

Tip Characterization for Scanned Probe Microscope Width Metrology

Author(s)
Samuel Dongmo, John S. Villarrubia, Samuel N. Jones, Thomas B. Renegar, Michael T. Postek, Jun-Feng Song
Determination of the tip shape is an important prerequisite for converting the various scanning probe microscopies form imaging tools into dimensional metrology
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