Capacitance and Dissipation Factor Measurements from 1 kHz to 10 MHz
Andrew D. Koffman, Bryan C. Waltrip, Nile M. Oldham, S. Avramov
A measurement technique developed by K. Yokoi et al. At Hewlett-Packard Japan, Ltd. Has been duplicated and evaluated at NIST to characterize four-terminal pair capacitors. The technique is based on an accurate three-terminal measurement made at 1 kHz using a capacitance bridge and wideband single port measurements made between 30 MHz and 200 MHz using a network analyzer. The measurement data are fitted to the four-terminal-pair admittance model defined by R. Cutkosky to compute capacitance and dissipation factor at any frequency up to 10 MHz. Capacitors characterized using this technique will be used as impedance reference standards for a general-purpose digital impedance bridge recently developed at NIST to calibrate inductors and ac resistors. The technique could also lead to a future NIST Special Test for dissipation factor.
1998 National Conference of Standards Laboratories Workshop and Symposium (NCSL)
, Waltrip, B.
, Oldham, N.
and Avramov, S.
Capacitance and Dissipation Factor Measurements from 1 kHz to 10 MHz, 1998 National Conference of Standards Laboratories Workshop and Symposium (NCSL), Albuquerque, NM, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=5060
(Accessed December 10, 2023)