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Conferences

In-Situ Monitoring of Product Shrinkage During Injection Molding Using an Optical Sensor

January 1, 1999

Author(s)

C L. Thomas, Anthony J. Bur

We have used an optical fiber sensor for in-situ monitoring of product shrinkage during injection molding. The sensor, consisting of a bundle of optical fibers...

Second Intercomparison of Radiation Temperature Scales among Four National Metrological Laboratories Using a Transfer Standard Radiation Thermometer, ed. by J.F. Dubbeldam and M.J. de Groot

January 1, 1999

Author(s)

F Sakuma, H Sakate, Charles E. Gibson, B. Carol Johnson, Graham Machin, J Fischer

ITS-90 Calibration of Radiometers Using Wire/Thin-Film Thermocouples in the NIST RTP Tool: Experimental Procedures and Results

January 1, 1999

Author(s)

C W. Meyers, David W. Allen, D P. DeWitt, K G. Kreider, Francis J. Lovas, Benjamin K. Tsai

Colorimetric Accuracies and Concerns in Spectroradiometry of LEDs

January 1, 1999

Author(s)

C F. Jones, Yoshi Ohno

Improved VO₂ Microbolometers for Infrared Imaging: Operation on the Semiconducting-Metallic Phase Transition with Negative Electrothermal Feedback

January 1, 1999

Author(s)

Carl D. Reintsema, Erich N. Grossman, Jonathan A. Koch

We have investigated the performance of VO 2 microbolometers biased on the semiconducting-metal phase transition with negative electrothermal feedback. We...

-NIST FT700 Vacuum Ultraviolet Fourier Transform Spectrometer: applications in ultraviolet spectrometry and radiometry,-

January 1, 1999

Author(s)

U Griesmann, R Kling, John H. Burnett, L Bratasz

Precision Spectroscopy in He as a Test of QED

January 1, 1999

Author(s)

S D. Bergeson, A Balakrishnan, G H. Baldwin, Thomas B. Lucatorto, J P. Marangos, T J. McIlrath, Thomas R. O'Brian, S L. Rolston, Craig J. Sansonetti, J Wen, N Westbrook, C H. Cheng, E E. Eyler

Precision Spectroscopy in He as a Test of QED Calculation

January 1, 1999

Author(s)

S D. Bergeson, A Balakrishnan, K G. Baldwin, Thomas B. Lucatorto, J P. Marangos, T J. Mcilrath, Thomas R. O'Brian, Steven L. Rolston, Craig J. Sansonetti, J Wen, N Westbrook

A Novel Multiaxial Wear Tester for Accelerated Testing of Materials

January 1, 1999

Author(s)

M C. Shen, Stephen M. Hsu, John A. Tesk, A Christou

Thermal and Structural Behavior of Metallocene-Type Random Propylene Copolymers.

January 1, 1999

Author(s)

R G. Alamo, J R. Isasi, M S. Kim, L Mandelkern, David L. VanderHart

In-Line Investigation of Shear-Induced Morphology Transition in Liquid Crystalline Polymer/PET Blends

January 1, 1999

Author(s)

F Qiao, Kalman D. Migler, Charles C. Han

The Effect of Water on the Fatigue Behavior for a Pultruded Glass-Reinforced Composite

January 1, 1999

Author(s)

Kate Liao, Carl R. Schultesiz, Donald L. Hunston, L C. Brinson

A Thermo-Viscoelastic Model for the Modulus of Epoxy during Cure

January 1, 1999

Author(s)

S L. Simon, O Sindt, G B. McKenna

Thermal Expansion and Its Effect on the Normal Force for a Modified Force Rebalance Transducer

January 1, 1999

Author(s)

Carl R. Schultesiz, G B. McKenna

Prior work in this laboratory [Niemiec, et al, J. Rheology, 40, 323-334 (1996)] showed that anomalous normal forces could arise in rotary shear measurements...

Simultaneous Measurement of Torque, Axial Force and Volume Change in the Torsional Dilatometer and the Implications for Constitutive Modeling

January 1, 1999

Author(s)

Carl R. Schultesiz, G B. McKenna

The NIST Torsional Dilatometer measures simultaneously the torque, axial normal force and volume change in response to a torsional deformation. In stress...

Mobility of Polymers in Nanometer Slits: Kinetics of Polymer Melt Intercalation in Layered Silicates

January 1, 1999

Author(s)

H Chen, J Demeter, E Manias, E P. Giannelis, N Hadjichristidis, Alamgir Karim

The mobility of polymer inside organically modifieed 2nm slits depends strongly on the intercalation between the polymer and the surface inside the galleries...

Polarization of Light Scattered by Particles on Silicon Wafers

January 1, 1999

Author(s)

Li Piin Sung, George W. Mulholland, Thomas Germer

Bidirectional ellipsometry has been developed as a technique for distinguishing among various scattering features near surfaces.Employi Employing incident light...

Analysis of the Sampling Behavior of a Phase Doppler Interferometer

January 1, 1999

Author(s)

J F. Widmann, S R. Charagundla, Cary Presser, Grace L. Yang, Stefan D. Leigh

A phase Doppler interferometer (PDI) was used to measure the intensity (i.e., the expected number of droplets measured per unit time) of a swirling methanol...

Process Specification Language (PSL): Results of the First Pilot Implementation

January 1, 1999

Author(s)

Craig I. Schlenoff, Michael Gruninger, Mihai Ciocoiu, Donald E. Libes

In all types of communication, the ability to share information is often hindered because the meanig of information can be drastically affected by the context...

Ultrafast photodetectors with near-unity quantum efficiency

January 1, 1999

Author(s)

G. Ulu, M. Gvkkavas, M. S. {Umlat}nl{umlat}, N. Biyikli, E. {Omlat}zbay, Richard Mirin, David H. Christensen

We designed, fabricated and characterized Al xGa 1-xAs/GaAs p-i-n resonant cavity enhanced (RCE) photodetectors with near-unit quantum efficiency. The peak...

NIST's Switched Coupler High Power Measurement Service

January 1, 1999

Author(s)

J. W. Allen

Characterization of Power Electronics System Interconnect Parasitics Using Time Domain Reflectometry

December 31, 1998

Author(s)

Huibin Zhu, Allen R. Hefner Jr., Jih-Sheng Lai

The significance of interconnect parasitics of power electronics system is their affects on converters' EMI-related performances, such as voltage/current spikes...

Accurate Modeling and Analysis of PWM Inverters for Electromagnetic Compatibility Performance Evaluation

December 31, 1998

Author(s)

Huibin Zhu, Yi-hua Tang, Jih-Sheng Lai, Allen R. Hefner Jr.

For the purpose of electromagnetic compatibility (EMC) performance investigation and prediction, accurate modeling and analysis are performed on IGBT PWM...

Reliability Test Chips: NIST 33 & NIST 34 for JEDEC Inter-Laboratory Experiments and More

December 31, 1998

Author(s)

Harry A. Schafft

Two reliability test patterns, NIST 33 and NIST 34, are being designed, and a third, NIST 36, is being planned to be used in a number of inter-laboratory...

Reliability Characterization of Ultra-Thin Film Dielectrics

December 31, 1998

Author(s)

John S. Suehle

The reliability of gate oxides is becoming a critical concern as oxide thickness is scaled below 4 mm in advanced CMOS technologies. Traditional reliability...

Extraction of Sheet-Resistance from Four-Terminal Sheet Resistors in Monocrystalline Films Having Non-Planar Geometries

December 31, 1998

Author(s)

Michael W. Cresswell, Nadine Guillaume, Richard A. Allen, William F. Guthrie, Rathindra Ghoshtagore, James C. OwenI II, Z. Osborne, N. Sullivan, Loren W. Linholm

This paper describes methods for the extraction of sheet resistance from V/I measurements made on four-terminal sheet resistors incorporated into electrical...

Failure Dynamics of the IGBT During Turn-Off for Unclamped Inductive Loading Conditions

December 31, 1998

Author(s)

Chien-Chung Shen, Allen R. Hefner Jr., David W. Berning, J B. Bernstein

The internal failure dynamics of the Insulated Gate Bipolar Transistor (IBGT) for unclamped inductive switching (UIS) conditions are studied using simulations...

Convection-Based Accelerometer and Tilt Sensor Implemented in Standard CMOS

December 31, 1998

Author(s)

V. Milanovic, E. D. Bowen, N. H. Tea, John S. Suehle, B. Payne, Mona E. Zaghloul, Michael Gaitan

Thin Film Ellipsometry Metrology

December 31, 1998

Author(s)

P. Durgapal, James R. Ehrstein, Nhan Van Nguyen

MEMS-Based Test Structures for IC Technology

December 31, 1998

Author(s)

S. A. Smee, Michael Gaitan, Yogendra K. Joshi, David L. Blackburn

As Integrated Circuit (IC) device sizes shrink, intrinsic and thermo-mechanical stress in interconnects is an ever increasing reliability concern. Increasing...

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