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Conferences

Automation of NIST Frequency Calibrations at Remote Sites,

January 1, 1999

Author(s)

Michael A. Lombardi

Preliminary Accuracy Evaluation of a Cesium Fountain Primary Frequency Standard at NIST

January 1, 1999

Author(s)

Steven R. Jefferts, D M. Meekhof, Jon H. Shirley, Thomas E. Parker

PARCS: A Primary Atomic Reference Clock in Space

January 1, 1999

Author(s)

Steven R. Jefferts, Thomas P. Heavner, Leo W. Hollberg

Authenticating Time and Frequency Signals

January 1, 1999

Author(s)

Judah Levine

Broadband optical comb generation with a frequency modulated parametric oscillator, ed. by R. Blatt

January 1, 1999

Author(s)

Scott A. Diddams, L -. Ma, Jun Ye, John L. Hall

Effects of Antenna Cables on GPS Timing Receivers

January 1, 1999

Author(s)

Marc A. Weiss, F G. Ascarrunz, Thomas E. Parker, Victor S. Zhang, X Gao

Performance of a Hydrogen Maser Ensemble and Characterization of Frequency Standards

January 1, 1999

Author(s)

Thomas E. Parker

Total Variance Explained

January 1, 1999

Author(s)

David A. Howe

Limited Live-Time Measurements of Frequency Stability

January 1, 1999

Author(s)

David A. Howe, E E. Hagn

Diffusivity-Porosity Relation for Cement Paste

January 1, 1999

Author(s)

Edward J. Garboczi, Dale P. Bentz

The development of a ionic diffusivity-porosity relation for cement paste, soundly based on microstructure, along with future developments in this area, are...

Atomic Ion Crystals in Non-Neutral Plasmas

January 1, 1999

Author(s)

John J. Bollinger, T M. Mitchell, X -. Huang, Wayne M. Itano, Joseph N. Tan, Branislav M. Jelenkovic, David J. Wineland

Telepresence: A New Paradigm for Solving Contamination Problems

January 1, 1999

Author(s)

Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec

When a contamination event occurs in a semiconductor fab, a process engineer must act quickly to find the cause. It is cost-prohibitive to maintain a full...

Telepresence: A New Paradigm for Solving Contamination Problems

January 1, 1999

Author(s)

Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec

When a contamination event occurs in a semiconductor fab, a process engineer must act quickly to find the cause. It is cost-prohibitive to maintain a full...

Case Hardening Measurement with Quantitative Surface Acoustic Microscopy

January 1, 1999

Author(s)

Nelson N. Hsu, D Xiang, Gerald V. Blessing

Case hardening is widely applied to many critical parts in the automotive industry. Determining the hardened case depth is presently a time-consuming...

Experiences in micro-milling and micro-drilling

January 1, 1999

Author(s)

Bradley N. Damazo, Matthew A. Davies, Brian S. Dutterer, Michael Kennedy

The field of micromachining is expanding to meet the demand for increased functionality for smaller components. This paper represents experiences learned in...

A Summary of Micro-milling Studies

January 1, 1999

Author(s)

Bradley N. Damazo, Matthew A. Davies, Brian S. Dutterer, Michael Kennedy

The importance of micro-milling grows as the demand for smaller parts within the medical, telecommunications, and aerospace industries increase. Unlike...