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Conferences

Research Trends in Lead-Free Soldering in the U.S.: NCMS Lead-Free Solder Project

February 1, 1999

Author(s)

I Artaki, D Noctor, C Desantis, W Desaulnier, L Felton, M Palmer, J Felty, J Greaves, C A. Handwerker, J D. Mather, S Schroeder, D Napp, TG Y. Pan, J Rosser, P Vianco, G Whitten, Y Zhu

In 1997, the National Center for Manufacturing Sciences Lead- Free Solder Project carried out by a consortium of 11 industrial corporations, academic...

The EXPRESS Web Server

February 1, 1999

Author(s)

Joshua Lubell, David A. Sauder

The EXPRESS Web Server is a World Wide Web interface for standards developers creating specifications for STEP, the Standard for the Exchange of Product Model...

Accurate Wavelength Calibration References for Wavelength Division Multiplexing

February 1, 1999

Author(s)

Sarah L. Gilbert, William C. Swann

NIST has developed transfer standards and high-accuracy internal standards for wavelength calibration in the 1500 nm region.

Erbium/Ytterbium-Codoped Glass Waveguide Laser Producing 170 mW or Output Power at 1540 nm

February 1, 1999

Author(s)

David S. Funk, D. L. Veasey, P. M. Peters, Norman Sanford, N. H. Fontaine, Joseph S. Hayden

Simulated-eye-design Camera for High-Contrast Measurements

January 30, 1999

Author(s)

Edward F. Kelley

Light-measurement instrumentation based upon high-quality charge-coupled-devices (CCD) is currently in use for measuring the characteristics of electronic...

Spectral Mapping of Multimode Vertical-Cavity Surface-Emitting Lasers by Near-Field Scanning Optical Microscopy

January 28, 1999

Author(s)

K. J. Knopp, David H. Christensen, G. H. Vander Rhodes, J. M. Pomeroy, B. B. Goldberg, M. S. {Umlat}nl{umlat}

Fourier-Transform Microwave Spectroscopy of Chemical-Warfare Agents and their Synthetic Precursors

January 18, 1999

Author(s)

Angela R. Hight Walker, R D. Suenram, A C. Samuels, J O. Jensen, D Woolard, W Wiebach

Fourier-transform microwave (FTMW) spectroscopy is an established technique for observing the rotational spectra of molecules and complexes in molecular beams...

Ultra-Thin Film Dielectric Reliability Characterization

January 15, 1999

Author(s)

John S. Suehle

The reliability of gate oxides is becoming a critical concern as oxide thickness is scaled below 4 nm in future technology nodes. The breakdown detection...

A Java-Based Tool for Testing the Interoperable MPI Protocol

January 12, 1999

Author(s)

William L. George, John G. Hagedorn, J E. Devaney

Java and the World Wide Web are used as the basis of a tool that tests conformance with the InteroperableMessage Passing Interface communication protocol. The...

Simulated-eye-design Camera for High-contrast Measurements

January 1, 1999

Author(s)

Edward F. Kelley

Light-measurement instrumentation based upon high-quality charge-coupled-devices (CCD) is currently in use for measuring the characteristics of electronic...

Quantum Computation, Spectroscopy of Trapped Ions, and Schrödinger Cat

January 1, 1999

Author(s)

David J. Wineland, C Monroe, Wayne M. Itano, D Kielpinski, B E. King, C J. Myatt

We summarize e orts at NIST to implement quantum computation using trapped ions, based on a scheme proposed by J.I. Cirac and P. Zoller (Innsbruck University)...

Computer Modelling of Interfacial Transition Zone: Microstructure and Properties.

January 1, 1999

Author(s)

Dale P. Bentz, Edward J. Garboczi

Many of the experimental advances in understanding interfacial transition zone (ITZ) microstructure and its role in the performance of cement-based composites...

Sources of Error in Absolute Distance Interferometry

January 1, 1999

Author(s)

Jack A. Stone Jr., Alois Stejskal, Lowell P. Howard

In this paper we describe the status of our research on the use of diode lasers for absolute distance interferometry, and we discuss the major sources of...

Diode Lasers in Length Metrology: Application to Absolute Distance Interferometry

January 1, 1999

Author(s)

Jack A. Stone Jr., Lowell P. Howard, Alois Stejskal

Diode lasers are becoming increasingly important in length metrology. In particular, the tunability of diode lasers makes them attractive for applications such...

Traceability in Time and Frequency Metrology

January 1, 1999

Author(s)

Michael A. Lombardi

Automation of NIST Frequency Calibrations at Remote Sites,

January 1, 1999

Author(s)

Michael A. Lombardi

Preliminary Accuracy Evaluation of a Cesium Fountain Primary Frequency Standard at NIST

January 1, 1999

Author(s)

Steven R. Jefferts, D M. Meekhof, Jon H. Shirley, Thomas E. Parker

PARCS: A Primary Atomic Reference Clock in Space

January 1, 1999

Author(s)

Steven R. Jefferts, Thomas P. Heavner, Leo W. Hollberg

Authenticating Time and Frequency Signals

January 1, 1999

Author(s)

Judah Levine

Broadband optical comb generation with a frequency modulated parametric oscillator, ed. by R. Blatt

January 1, 1999

Author(s)

Scott A. Diddams, L -. Ma, Jun Ye, John L. Hall

Effects of Antenna Cables on GPS Timing Receivers

January 1, 1999

Author(s)

Marc A. Weiss, F G. Ascarrunz, Thomas E. Parker, Victor S. Zhang, X Gao

Performance of a Hydrogen Maser Ensemble and Characterization of Frequency Standards

January 1, 1999

Author(s)

Thomas E. Parker

Total Variance Explained

January 1, 1999

Author(s)

David A. Howe

Limited Live-Time Measurements of Frequency Stability

January 1, 1999

Author(s)

David A. Howe, E E. Hagn

Diffusivity-Porosity Relation for Cement Paste

January 1, 1999

Author(s)

Edward J. Garboczi, Dale P. Bentz

The development of a ionic diffusivity-porosity relation for cement paste, soundly based on microstructure, along with future developments in this area, are...

Atomic Ion Crystals in Non-Neutral Plasmas

January 1, 1999

Author(s)

John J. Bollinger, T M. Mitchell, X -. Huang, Wayne M. Itano, Joseph N. Tan, Branislav M. Jelenkovic, David J. Wineland

Telepresence: A New Paradigm for Solving Contamination Problems

January 1, 1999

Author(s)

Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec

When a contamination event occurs in a semiconductor fab, a process engineer must act quickly to find the cause. It is cost-prohibitive to maintain a full...

Telepresence: A New Paradigm for Solving Contamination Problems

January 1, 1999

Author(s)

Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec

When a contamination event occurs in a semiconductor fab, a process engineer must act quickly to find the cause. It is cost-prohibitive to maintain a full...

Case Hardening Measurement with Quantitative Surface Acoustic Microscopy

January 1, 1999

Author(s)

Nelson N. Hsu, D Xiang, Gerald V. Blessing

Case hardening is widely applied to many critical parts in the automotive industry. Determining the hardened case depth is presently a time-consuming...

Experiences in micro-milling and micro-drilling

January 1, 1999

Author(s)

Bradley N. Damazo, Matthew A. Davies, Brian S. Dutterer, Michael Kennedy

The field of micromachining is expanding to meet the demand for increased functionality for smaller components. This paper represents experiences learned in...

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