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Conferences

Ultrafast photodetectors with near-unity quantum efficiency

Author(s)
G. Ulu, M. Gvkkavas, M. S. {Umlat}nl{umlat}, N. Biyikli, E. {Omlat}zbay, Richard Mirin, David H. Christensen
We designed, fabricated and characterized Al xGa 1-xAs/GaAs p-i-n resonant cavity enhanced (RCE) photodetectors with near-unit quantum efficiency. The peak

Precision Spectroscopy in He as a Test of QED

Author(s)
S D. Bergeson, A Balakrishnan, G H. Baldwin, Thomas B. Lucatorto, J P. Marangos, T J. McIlrath, Thomas R. O'Brian, S L. Rolston, Craig J. Sansonetti, J Wen, N Westbrook, C H. Cheng, E E. Eyler

MEMS-Based Test Structures for IC Technology

Author(s)
S. A. Smee, Michael Gaitan, Yogendra K. Joshi, David L. Blackburn
As Integrated Circuit (IC) device sizes shrink, intrinsic and thermo-mechanical stress in interconnects is an ever increasing reliability concern. Increasing

Dopant Characterization Round-Robin Study Performed on Two-Dimensional Test Structures Fabricated at Texas Instruments

Author(s)
J. Vahakangas, Markku Lahti, M C. Chang, H Edward, C F. Machala, R S. Martin, V Zavyalov, J S. McMurray, C. C. Williams, P DeWolf, Vandevorst, D. Venables, S S. Neogi, D L. Ottaviani, Joseph Kopanski, J F. Machiando, Brian G. Rennex, J N. Nxulamo, Y Li, D J. Thomson
The lack of a two-dimensional (2D) dopant standard, and hence, a priori knowledge of dopant distribution makes it impossible to unambiguously judge accuracy of
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