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Conferences

Case Hardening Measurement with Quantitative Surface Acoustic Microscopy

January 1, 1999

Author(s)

Nelson N. Hsu, D Xiang, Gerald V. Blessing

Case hardening is widely applied to many critical parts in the automotive industry. Determining the hardened case depth is presently a time-consuming...

Experiences in micro-milling and micro-drilling

January 1, 1999

Author(s)

Bradley N. Damazo, Matthew A. Davies, Brian S. Dutterer, Michael Kennedy

The field of micromachining is expanding to meet the demand for increased functionality for smaller components. This paper represents experiences learned in...

A Summary of Micro-milling Studies

January 1, 1999

Author(s)

Bradley N. Damazo, Matthew A. Davies, Brian S. Dutterer, Michael Kennedy

The importance of micro-milling grows as the demand for smaller parts within the medical, telecommunications, and aerospace industries increase. Unlike...

Polymeric Materials Interest Group Workshop: Quantitative Determination of Synthetic Polymer Molecular Mass Distribution

January 1, 1999

Author(s)

William E. Wallace

Preliminary report on the NIST molecular mass distribution interlaboratory comparison.

Stress Relaxation of Poly(Ethylene Naphthalate): Isothermal, Isochronal, and Isostructural Responses

January 1, 1999

Author(s)

M L. Cerrada, G B. McKenna

Orientation Texture from Polymeric Materials Using Scattering Methods

January 1, 1999

Author(s)

J D. Barnes

The Effects of Steady Shear on the Order and Orientation of a Diblock Copolymer Melt using In-Situ Small-Angle Neutron Scattering

January 1, 1999

Author(s)

K A. Barnes, F A. Morrison, A Nakatani, J W. Mays

Fluorescence Anisotropy Measurements of Oriented Polymers

January 1, 1999

Author(s)

Anthony J. Bur, S C. Roth

Stabilizing and measuring optical frequencies, ed by R. Blatt

January 1, 1999

Author(s)

John L. Hall, M S. Taubman, Scott A. Diddams, B Tiemann, Jun Ye, L -. Ma, D J. Jones, Steven T. Cundiff

Quantum Computation, Spectroscopy of Trapped Ions, and Schrödinger's Cat

January 1, 1999

Author(s)

Q A. Turchette, Chris S. Wood

An All-Diode-Laser Optical Frequency Standard Based on Laser-Trapped Ca Atoms

January 1, 1999

Author(s)

Christopher W. Oates, F Bondu, Leo W. Hollberg

Determination of Radiance Temperatures using Detectors Calibrated for Absolute Spectral Power Response, ed. by J.F. Dubbeldam and M.J. de Groot

January 1, 1999

Author(s)

Howard W. Yoon, Charles E. Gibson

ITS-90 Calibration of Radiometers Using Wire/Thin-Film Thermocouples in the NIST RTP Tool: Effective Emissivity Modeling

January 1, 1999

Author(s)

Benjamin K. Tsai, D P. DeWitt

Chamber Radiation Effects on Calibration of Radiation Thermometers with a Thin-Film Thermocouple Test Wafer, ed. by J.F. Dubbeldam and M.J. de Groot

January 1, 1999

Author(s)

Benjamin K. Tsai, D P. DeWitt, Francis J. Lovas, K G. Kreider, C W. Meyer, David W. Allen

Recent Developments in Detector-Based Photometry and Future Needs in Photometry

January 1, 1999

Author(s)

Yoshihiro Ohno

Report on the CIE Workshop: Photometry of Flashing Lights

January 1, 1999

Author(s)

Yoshihiro Ohno

Gloss Measurements at NIST

January 1, 1999

Author(s)

Maria E. Nadal, E A. Early, E A. Thompson

FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers

January 1, 1999

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

Polarized Light Scattering Measurements of Roughness, Subsurface Defects, Particles, and Dielectric Layers on Silicon Wafers, ed. by F. Obelleiro, J.L. Rodr{iacute}guez, and T. Wriedt

January 1, 1999

Author(s)

Thomas A. Germer, L Sung

Improved-accuracy Tristimulus Colorimeters Calibrated with Standard Detectors

January 1, 1999

Author(s)

George P. Eppeldauer

Standard Detector Based Calibration Method for Tristimulus Colorimeters

January 1, 1999

Author(s)

George P. Eppeldauer

Measuring the Geometric Errors of a Hexapod Machine Tool

January 1, 1999

Author(s)

Johannes A. Soons

This paper describes procedures to measure the geometric errors of parallel kinematic machines with a Gough configuration. The procedures are applied to...

Microwave Network Analyzers - A Discussion of Verification Methods

January 1, 1999

Author(s)

Ronald A. Ginley

Verification of Vector Network Analyzers (VNAs) is very important to the measurement process as well as to establish confidence in the uncertainty of the system...