Stone, J.
, Howard, L.
and Stejskal, A.
(1999),
Diode Lasers in Length Metrology: Application to Absolute Distance Interferometry, Proceedings of Measurement Science Conference, Anaheim, CA
(Accessed May 20, 2025)
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Diode Lasers in Length Metrology: Application to Absolute Distance Interferometry
Published
Author(s)
, ,
Abstract
Diode lasers are becoming increasingly important in length metrology. In particular, the tunability of diode lasers makes them attractive for applications such as absolute distance interferometry (ADI). In this paper we describe the current status of our research on the use of diode lasers in ADI and we discuss, more generally, the unique strengths and weaknesses of diode lasers for applications to length measurement. For standard interferometry, a diode laser is usually a poor replacement for a helium-neon laser, but in selected applications the capabilities of the diode can provide significant advantages.Proceedings Title
Proceedings of Measurement Science Conference
Conference Dates
January 28-29, 1999
Conference Location
Anaheim, CA
Conference Title
Measurements Science Conference
Pub Type
Conferences
Keywords
absolute distance interferometry, dimensional metrology, diode lasers, length measurement, wavelength sweeping
Citation
Issues
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Created January 1, 1999, Updated February 19, 2017