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Chamber Radiation Effects on Calibration of Radiation Thermometers with a Thin-Film Thermocouple Test Wafer, ed. by J.F. Dubbeldam and M.J. de Groot

Published

Author(s)

Benjamin K. Tsai, D P. DeWitt, Francis J. Lovas, K G. Kreider, C W. Meyer, David W. Allen
Proceedings Title
TEMPMEKO ''99
Conference Dates
June 1-3, 1999
Conference Location
Delft, MD
Conference Title
Proc. 7^uth^ Intl. Symp. on Temp. and Thermal Meas. in Industry and Science

Citation

Tsai, B. , DeWitt, D. , Lovas, F. , Kreider, K. , Meyer, C. and Allen, D. (1999), Chamber Radiation Effects on Calibration of Radiation Thermometers with a Thin-Film Thermocouple Test Wafer, ed. by J.F. Dubbeldam and M.J. de Groot, TEMPMEKO ''99 , Delft, MD (Accessed May 29, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 1999, Updated February 17, 2017