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Conferences

Polystyrene Box Uniform Light Sources

May 1, 1999

Author(s)

Edward F. Kelley

Evaluation of Light Measuring Devices for Flying-Spot Display Measurements

May 1, 1999

Author(s)

Paul A. Boynton

Calculable Coaxial Resistors for Precision Measurements

May 1, 1999

Author(s)

Randolph E. Elmquist

Coaxial straight-wire resistors have been constructed with the purpose of improving comparisons between resistors, capacitors, and inductors in the audio...

Flat-Panel Display Measurements and Standards

May 1, 1999

Author(s)

Edward F. Kelley

0.1-10 GHZ CMOS Voltage Standard

May 1, 1999

Author(s)

Dylan F. Williams, Dave K. Walker

We discuss the development of a sinusoidal CMOS voltage standard. The standard incorporates a FET power sensor that transfers the voltage measured at a primary...

Overview of the Manufacture and Certification of Electrodeposited Coating Thickness Standard Reference Materials

May 1, 1999

Author(s)

Carlos R. Beauchamp, Hilary B. Gates, David R. Kelley, Stefan D. Leigh

This paper documents major changes in the production of Electrodeposited Coating Thickness Standard Reference Materials. These standards consist of pre...

Characterization of Nanostructured Tungsten Heavy Alloy Produced by Double Ball Milling

May 1, 1999

Author(s)

Frank S. Biancaniello, Stephen D. Ridder, Maureen E. Williams, Rodney D. Jiggetts, L S. Magness

Tungsten powder was ball milled in a controlled atmosphere environment with rapidly solidified powders to produce a nanostructured material. The milled powders...

Characterization of Atomized High Nitrogen Stainless Steel as a Possible Implant Material

May 1, 1999

Author(s)

Frank S. Biancaniello, Rodney D. Jiggetts, Richard E. Ricker, Stephen D. Ridder

High Nitrogen Stainless Steel (HNSS) can simultaneously have high strength (ultimate and yield), high hardness, high ductility, and outstanding corrosion...

The Formation and Behavior of Particles in Silane Discharges

May 1, 1999

Author(s)

Alan Gallagher

Particle growth in silane RF discharges and the incorporation of particles into hydrogenated-amorphous-silicon (a-Si: H) devices is described. Measurements of...

Comparison of Sheet-Resistance Measurements Obtained By Standard and Small-Area Four-Point Probing

May 1, 1999

Author(s)

Nadine Guillaume, Michael W. Cresswell, Richard A. Allen, Sarah C. Everist, Loren W. Linholm

A modification of the standard four-point probing technique has been developed for measuring the sheet resistance of conducting films. Although the areas of...

Characteristic Impedance, Causality, and Microwave Circuit Theory

May 1, 1999

Author(s)

Dylan Williams, Bradley Alpert

A new waveguide equivalent-circuit theory guarantees causality of the network parameters of passive devices.

Planar Near-Field Measurements Using Nonideal Measurement Points

May 1, 1999

Author(s)

Ronald C. Wittmann, Bradley Alpert, Michael H. Francis

Uncertainty Analysis for Four Terminal-Pair Capacitance and Dissipation Factor Characterization at 1 MHz and 10 MHz

May 1, 1999

Author(s)

Andrew D. Koffman, S. Avramov, Bryan C. Waltrip, Nile M. Oldham

Internet-Based Test Service for Multifunction Calibrators

May 1, 1999

Author(s)

Nile M. Oldham, Mark E. Parker

The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic

May 1, 1999

Author(s)

S. Avramov, Andrew D. Koffman, Nile M. Oldham, Bryan C. Waltrip

SIMnet - a Collaborative Tool for Metrology in the Americas

May 1, 1999

Author(s)

Piotr S. Filipski, Nile M. Oldham

The use of video conferencing equipment used with the Internet to facilitate international comparisons and collaborations is described. The system employs...

Robust Statistical Analysis of Vector Network Analyzer Intercomparisons

May 1, 1999

Author(s)

Robert M. Judish, Jolene Splett

Benchmark Database for Input and Validation of Spray Combustion Models

May 1, 1999

Author(s)

J F. Widmann, S R. Charagundla, Cary Presser

Control of process efficiency and the formation of species byproducts from industrial thermal oxidation systems (e.g., power generation and treatment of liquid...

Experimental Studies of Noise in a Dual Mode Oscillator,

April 13, 1999

Author(s)

Huascar Ascarrunz, F L. Walls, Eva Ferre-Pikal, V Tsarapkin, J Vig

Progress Towards ¹⁹⁹Hg⁺ Optical Frequency Standard

April 13, 1999

Author(s)

R J. Rafac, B C. Young, F C. Cruz, J A. Beall, James C. Bergquist, Wayne M. Itano, David J. Wineland

Doping and Oxidation Effects in Raman Spectra of Manganites

April 10, 1999

Author(s)

V B. Podobedov, A Weber, G U. Dezanneau, S U. Pignard, J U. Kreizel, H U. Vincent

Raman scattering from La yR xMnO 3-δ compounds ( single crystals, ceramics, films) was studied as a function of kind (R) and amount (x) of dopant as well as of...

Preface to Materials Research Society 1999 Proceedings

April 5, 1999

Author(s)

H. R. Huff, Curt A. Richter, M. L. Green, G. Lucovsky

This Materials research society Proceedings contains 81 papers presented at the Ultrathin SiO 2 and High-K Materials for gate Dielectrics Symposium, held April...

Performance Measurement of Remote ATM Clusters

April 1, 1999

Author(s)

C Martin, Alan Mink, Wayne J. Salamon, Michael D. Indovina, M M. Courson

We investigate the configuration and performance of remote commodity computing clusters. This is the dynamic pooling of separate clusters into a single large...

Specimen Preparation for Scanning Electron Microscopy

April 1, 1999

Author(s)

Paul E. Stutzman, J R. Clifton

Microscopy plays an important role in the examination of cementitious materials. Optical and electron-optical techniques allow examination of microstructural...

Primary Acoustic Thermometer for Use Up to 800 K

April 1, 1999

Author(s)

Dean C. Ripple, Dana R. Defibaugh, Keith A. Gillis, Michael R. Moldover

Primary acoustic thermometers determine the thermodynamic temperature of a monatomic gas from measurements of the speed of sound in the gas. Here, we describe...

The Kilogram: Last remaining artifact

April 1, 1999

Author(s)

Zeina J. Kubarych

The unit of mass, the kilogram, is the last remaining basic unit defined by an artifact. Worldwide efforts are underway to replace the artifact-based definition...

Fractal Dimension of Particle Outlines: Meaning, Utility, Limitations, Standard Images and Examples

April 1, 1999

Author(s)

David S. Bright

Only a handful of shape parameters, such as aspect ratio and circularity, are in common use for characterizing individual microscopic particles. The fractal...

Calibration Standards and Uncertainties in Radar Cross Section Measurements

April 1, 1999

Author(s)

Lorant A. Muth

Standards for radar cross section measurements are being developed cooperatively by NIST and DoD scientists.

4-D/RCS Reference Model Architecture for Unmanned Ground Vehicles

April 1, 1999

Author(s)

James S. Albus

4-D/RCS is the reference model architecture currently being developed for the Demo III Experimental Unmanned Vehicle program. 4-D/RCS integrates the NIST...

The Crystallization Behavior of Polybutadiene-Polycaprolactone (PB-b-PCL) Semicrystalline Block Copolymer Films

April 1, 1999

Author(s)

G Kim, C L. Jackson, F V. Gyldenfeldt, M Libera, R Stadler, Charles C. Han

This work describes the effect of the spherulitic growth of lamellar crystals on the morphology of a diblock copolymer rich in crystallinecomponent. For this...

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