Avramov, S.
, Koffman, A.
, Oldham, N.
and Waltrip, B.
(1999),
The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic, Proc. IEEE Instrumentation and Technology Conference (IMTC), Venice, 1, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=18201
(Accessed December 14, 2024)
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The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic
Published
Author(s)
S. Avramov, , ,
Proceedings Title
Proc. IEEE Instrumentation and Technology Conference (IMTC)
Conference Dates
May 24-26, 1999
Conference Location
Venice, 1, IT
Pub Type
Conferences
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Citation
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Created April 30, 1999, Updated October 12, 2021