Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Conferences

Practical method for measurement of AC-driven LEDs at a given junction temperature by using active heat sinks

September 15, 2009

Author(s)

Yuqin Zong, Pei-ting Chou, Min-Te Lin, Yoshihiro Ohno

Alternating-current (AC) driven high-power light-emitting diodes (LEDs) have become available and introduced into solid-state lighting (SSL) products. AC LEDs...

Microbial colonization on polymers: Effects of sample preparation and incorporation of quaternary ammonium salts

September 13, 2009

Author(s)

Nancy Lin, Diana N. Zeiger, Joseph M. Antonucci, Bruce O. Fowler, Christopher Stafford, Sheng Lin-Gibson

Controlling bacterial growth in the oral environment presents many challenges. To address these challenges, new materials and treatments are needed along with...

An electrical pulse-heated Kosky bar technique for high strain rate flow stress measurements of rapidly heated metals

September 13, 2009

Author(s)

Steven P. Mates, Stephen W. Banovic, Richard L. Rhorer, Timothy J. Burns, Eric P. Whitenton, D Basak

We have developed a unique electrical pulse-heated Kolsky Bar technique for measuring the flow stress of metals at heating rates of up to 6000 °C per second and...

A Spectroscopic Polarimeter For Detecting Chiral Signatures In Astrobiological Samples

September 11, 2009

Author(s)

Baoliang Wang, William Sparks, Thomas Germer, Andy Leadbetter

We have developed a polarimeter for accurately measuring both the circular and linear polarization components of a light beam from 400 nm to 800 nm. This...

Studying Long-term Performance of a Nano-ZnO filled Waterborne Polyurethane Coating using Spectroscopies and Microscopies

September 9, 2009

Author(s)

Xiaohong Gu, Dongmei Zhe, Stephanie S. Watson, Guodong Chen, Minhua Zhao, Paul E. Stutzman, Deborah S. Jacobs, Tinh Nguyen, Joannie W. Chin, Jonathan W. Martin

Although inorganic UV absorbers such as zinc oxide (ZnO) and cerium oxide (CeO2) exhibit numerous advantages compared to organic UV absorbers, the mechanisms of...

Testing the Performance of Hydrogen Sensors

September 8, 2009

Author(s)

Nathan D. Marsh, Thomas G. Cleary

The acceptance of hydrogen as a widely-available energy source will depend to some extent on the perceived and actual safe dispensing and storage of hydrogen by...

Prediction of Light Scattering and Ionization Chamber Sensor Response to Smolder Smoke Aerosols

September 8, 2009

Author(s)

Thomas G. Cleary, Jiann C. Yang

Diagnostic equipment developed for an International Space Station experiment, the Smoke Aerosol Measurement Experiment (SAME), utilized three measurement...

Full-Scale Residential Smoke Alarm Performance

September 8, 2009

Author(s)

Thomas G. Cleary

A series of 24 full-scale experiments were conducted in a multi-room structure to examine the effects of alarm type (photoelectric, ionization, and dual sensor)...

Alkylammonium Functionalized Montmorillonite-Epoxy Composites: Improvements in Mechanical Properties

September 7, 2009

Author(s)

Mickey Richardson, Gale A. Holmes

Organofunctionalized montmorillonite clays (MM) have been prepared with ammonium cations having a distribution of alkyl chain lengths. Relative to clays treated...

Correlation in Uncertainty of Measurement - A Discussion of State of the Art Techniques

September 6, 2009

Author(s)

Ruediger Kessel, Raghu N. Kacker

The Guide to the expression of uncertainty has been around for 15 years and has been widely adopted by science and industry. Over time more and more complex...

NIST Experience with Non-Rotating Force-Balanced Piston Gauges for Low Pressure Metrology

September 6, 2009

Author(s)

Jay H. Hendricks, Douglas A. Olson

The National Institute of Standards and Technology (NIST) Low Pressure Manometry Project maintains and operates primary standard ultrasonic interferometer...

GEOMETRIC MEASUREMENT COMPARISONS FOR ROCKWELL DIAMOND INDENTERS

September 6, 2009

Author(s)

Jun-Feng Song, Samuel R. Low III, Xiaoyu A. Zheng

In the uncertainty budget of Rockwell C hardness (HRC) tests, geometric error of the Rockwell diamond indenter is a major contributor. The geometric calibration...

Microfabricated multispectral MRI agents: a brief overview

September 3, 2009

Author(s)

Gary Zabow

This paper provides an introductory overview on recent top-down microfabricated, as opposed to traditional bottom-up chemically synthesized, magnetic resonance...

Accurate Picoscale Forces for Insitu Calibration of AFM

September 3, 2009

Author(s)

Koo-Hyun Chung, Gordon A. Shaw, Jon R. Pratt

The force sensitivity of an atomic force microscope is calibrated directly using an in situ realization of primary electrostatic forces ranging from 320 pN to 3...

Evaluation and Selection of Candidate Thermal Insulation Materials for NIST SRM 1450d, Fibrous-Glass Board

September 2, 2009

Author(s)

Robert R. Zarr, Dennis D. Leber

The evaluation of candidate thermal insulation materials for National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) 1450d...

Assessing the Measurement Uncertainty of Thermophysical Properties

September 2, 2009

Author(s)

Robert R. Zarr

A generalized approach for the expression of measurement uncertainty consistent with current international practice is presented. The approach is applicable to...

International Comparison on Thermal Conductivity Measurements of Insulating Materials by Guarded Hot Plate

September 2, 2009

Author(s)

Bruno Hay, Leonel Lira Cortes, Benoit Doucey, Jean Remy Filtz, Nikolay Sokolov, Clark Stacey, Robert R. Zarr, Jintao Zhang

An inter-laboratory comparison on thermal conductivity measurements of insulating materials is currently organized under the auspices of the Bureau...

Recent Progress in Understanding the Imaging and Metrology using the Helium Ion Microscope

September 1, 2009

Author(s)

Michael T. Postek, Andras Vladar, Bin Ming

Nanotechnology is pushing imaging and measurement instrument technology to high levels of required performance. As this continues, new barriers confronting...

Low noise up-conversion single photon detector and its applications in quantum information systems

August 28, 2009

Author(s)

Xiao Tang, Lijun Ma

We developed low-noise up-conversion single photon detectors for 1310 nm based on a periodically-poled LiNbO3 (PPLN) waveguide. The low-noise feature is...

A Decade of Commitment from the NIST Manufacturing Engineering Laboratory to Nanomanufacturing and Nanometrology

August 27, 2009

Author(s)

Kevin W. Lyons, Michael T. Postek

Advanced research in nanomanufacturing technologies and processes has continued at an accelerating rate over the past decade. Profitable niche applications such...

Documenting and Implementing Guidelines with Schematron

August 26, 2009

Author(s)

Joshua Lubell

Data exchange specifications must be broad and general in order to achieve acceptance, yet they must also be customizable in a controlled and interoperable...

Representing Layout Information in the CMSD Specification

August 26, 2009

Author(s)

Frank H. Riddick, Yung-Tsun T. Lee

Developing mechanisms for the efficient exchange of information between simulations and other manufacturing tools is a critical problem. For many areas of...

Input Data Management Methodology for Discrete Event Simulation

August 26, 2009

Author(s)

Nils E. Bengtsson, Guodong Shao, Yung-Tsun T. Lee, Swee K. Leong, Charles R. McLean, Bjorn Johansson, Anders Skoogh

Input Data Management (IDM) is a time consuming and costly process for Discrete Event Simulation (DES) projects. In this paper, a methodology for IDM in DES...

Measuring high-order coherences of chaotic and coherent optical states

August 24, 2009

Author(s)

Martin J. Stevens, Burm Baek, Eric Dauler, Andrew J. Kerman, Richard J. Molnar, Scott A. Hamilton, Karl Berggren, Richard P. Mirin, Sae Woo Nam

We demonstrate a new approach to measuring high-order temporal coherences that uses a four-element superconducting nanowire single-photon detector (SNSPD) in...

193 nm Angle-Resolved Scatterfield Microscope for Semiconductor Metrology

August 24, 2009

Author(s)

Martin Sohn, Richard Quintanilha, Bryan Barnes, Richard Silver

An angle-resolved scatterfield microscope (ARSM( feating 193 nm excimer laser light wa developed for measuring critical dimension (CD) and overlay of nanoscale...

Mobile Sensor Networks Self-organization for System Utility Maximization: Work in Progress

August 23, 2009

Author(s)

Vladimir V. Marbukh, Kamran Sayrafian

This paper reports on work in progress on mobile sensor network self-organization for system utility maximization with system utility being the difference...

Polyelectrolyte and Particle Adsorption to Nanopatterned Surfaces

August 23, 2009

Author(s)

Steven D. Hudson, Thuy Chastek

The adsorption of polyelectrolytes and nanoparticles onto patterned and curved surfaces is investigated (by fluorescence and electron microscopy) and exploited...

Interfacial Rheology in Complex Flow

August 23, 2009

Author(s)

Jeffrey D. Martin, Steven Hudson

Typical methods used to measure dynamic interfacial properties of multiphase liquid systems often employ drops that are much larger and flows that are much...

The Extension of the NIST BRDF Scale from 1100 nm to 2500 nm

August 21, 2009

Author(s)

Howard W. Yoon, David W. Allen, George P. Eppeldauer, Benjamin K. Tsai

Measurements of bi-directional reflectance factor for diffuse reflectance from 1100 nm to 2500 nm using extended-range indium gallium arsenide (exInGaAs)...

Effect of Nano-Silica Fillers on Surface Morphology and Mechanical Properties of Polymer-Silica Composites

August 20, 2009

Author(s)

Li Piin Sung, Dongmei Zhe, Aaron M. Forster, Peter Krommenhoek, Nancy J. Lin, Sheng Lin-Gibson

Investigation on the effect of nano-silica on the effect of nano-silica on the surface morphology and mechanical properties has been carried out on two...

Was this page helpful?