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Improved Permittivity Measurement of Dielectric Substrates by use of the TE111 Mode of a Split-Cylinder Cavity

Published

Author(s)

Michael D. Janezic, Uwe Arz, Shelley Begley, Phil Bartley

Abstract

We use the split-cylinder cavity's TE111 resonant mode, in addition to the higher-order TE0np modes, to extend the frequency range over which one can make nondestructive permittivity measurements of dielectric substrates. In addition to broadening the frequency range of the split-cylinder resonator, we also demonstrate that measurements performed with the TE111 mode help to calculate the frequency of the higher-order TE0np resonant modes, thus reducing mode-identification errors. We compare relative permittivity measurements of several low-loss dielectric substrates using both the TE111 and the higher-order TE0np modes and employ the Monte Carlo method to calculate the measurement uncertainties.
Proceedings Title
73rd ARFTG Microwave Measurement Conference
Conference Dates
June 12, 2009
Conference Location
Boston, MA

Keywords

Cavity, dielectric, loss tangent, permittivity, resonator, split-cylinder, substrate

Citation

Janezic, M. , Arz, U. , Begley, S. and Bartley, P. (2009), Improved Permittivity Measurement of Dielectric Substrates by use of the TE111 Mode of a Split-Cylinder Cavity, 73rd ARFTG Microwave Measurement Conference, Boston, MA, [online], https://doi.org/10.1109/ARFTG.2009.5278066 (Accessed May 23, 2024)

Issues

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Created June 12, 2009, Updated November 10, 2018