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Practical Applications of Nonlinear Measurements

Published

Author(s)

Catherine A. Remley

Abstract

We discuss the limitations of vector network analyzers in the measurement of nonlinear devices and circuits, including their inability to measure the relative phase between frequency components and the actual impedance in which a device is embedded. The architectures and calibration techniques for several types of instruments designed to satisfy these requirements are presented and compared. Examples of the use of these instruments for measurement and model development of nonlinear circuits are presented.
Proceedings Title
73rd ARFTG Microwave Measurement Symposium
Conference Dates
June 12, 2009
Conference Location
Boston, MA

Keywords

Linear measurements, Measurement-based Model, Nonlinear measurements, Nonlinear vector network analyzer, Vector network analyzer

Citation

Remley, C. (2009), Practical Applications of Nonlinear Measurements, 73rd ARFTG Microwave Measurement Symposium, Boston, MA, [online], https://doi.org/10.1109/ARFTG.2009.5278060 (Accessed May 22, 2022)
Created June 12, 2009, Updated November 10, 2018