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Conferences

Distinguishing Identical Twins by Face Recognition

Author(s)
P J. Phillips, Patrick J. Flynn, Kevin W. Bowyer, Richard W. Vorder Bruegge, Patrick J. Grother, George W. Quinn, Matthew Pruitt
The paper measures the ability of face recognition algorithms to distinguish between identical twin siblings. The experimental dataset consists of images taken

An Introduction to the Good, the Bad, & the Ugly Face Recognition Challenge Problem

Author(s)
P J. Phillips, J. R. Beveridge, Bruce A. Draper, Geof H. Givens, Alice J. O'Toole, David Bolme, Joseph Dunlop, Yui M. Lui, Hassan A. Sahibzada, Samuel Weimer
The Good, the Bad, & the Ugly Face Challenge Problem was created to encourage the development of algorithms that are robust to recognition across changes that

When High-Quality Face Images Match Poorly

Author(s)
J. R. Beveridge, P. Jonathon Phillips, Geof H. Givens, Bruce A. Draper, Mohammad N. Teli, David Bolme
In face recognition, quality is typically thought of as a property of individual images, not image pairs. The implicit assumption is that high-quality images

A Component-based Approach for Manufacturing Simulation

Author(s)
Frank H. Riddick, Yung-Tsun T. Lee, Deogratias Kibira, Stephen B. Balakirsky
Manufacturing systems can be very complex and are often costly to develop and operate. Simulation technology has been shown to be an effective tool for

Rapid, high resolution frequency comb measurements

Author(s)
Ian R. Coddington, Fabrizio R. Giorgetta, Esther Baumann, William C. Swann, Nathan R. Newbury
Frequency combs serve as an extremely high accuracy reference across broad portions of the optical spectrum. Dual frequency combs harness this accuracy and

Manipulation of adhesion via sub-surface patterning

Author(s)
John A. Howarter, Peter M. Johnson, Jun Y. Chung, Christopher Stafford
The delamination characteristics of patterned and hierarchical interfaces are of great interest due to the advanced adhesion capabilities found with many

Advanced Sensing Towards Improved Forklift Safety

Author(s)
Roger V. Bostelman, William P. Shackleford
The National Institute of Standards and Technology's Intelligent Systems Division has been researching advanced three-dimensional (3D) imaging sensors and their
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