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OCT For Depth Detection of Buried Particles in Polymeric Materials

Published

Author(s)

Robert C. Chang, Anant Agrawal, Peter M. Johnson, Christopher Stafford

Abstract

In this work, we demonstrate a method to produce novel optical phantoms usable for the characterization of OCT axial resolution and contrast. By varying the diameter of the microspheres and the thickness of the polymer layers, different spatial frequencies can be replicated in the axial dimension of the phantom. These frequencies provide a methodology to determine the axial contrast transfer function for an OCT system. Because the phantom dimensions can be determined and verified independently of the OCT measurement, no information about the system s spatial calibration is required. Such a test system will enable a more accurate and repeatable determination of buried occlusion/particle distribution within polymer coatings, adhesives and biological materials.
Proceedings Title
Adhesion Society Extended Abstracts
Conference Dates
February 13-16, 2011
Conference Location
Savannah, GA, US
Conference Title
2011 Annual Meeting of the Adhesion Society

Keywords

optical computed tomography, particles, polymer, depth profiling

Citation

Chang, R. , Agrawal, A. , Johnson, P. and Stafford, C. (2011), OCT For Depth Detection of Buried Particles in Polymeric Materials, Adhesion Society Extended Abstracts, Savannah, GA, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907565 (Accessed April 16, 2024)
Created February 12, 2011, Updated October 14, 2021