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Rapid, high resolution frequency comb measurements

Published

Author(s)

Ian R. Coddington, Fabrizio R. Giorgetta, Esther Baumann, William C. Swann, Nathan R. Newbury

Abstract

Frequency combs serve as an extremely high accuracy reference across broad portions of the optical spectrum. Dual frequency combs harness this accuracy and allow for fast and highly flexible measurements of passive and active sources.
Proceedings Title
Advanced Solid-State Photonics 2011
Volume
AME1
Conference Dates
February 13-16, 2011
Conference Location
Istanbul

Keywords

Frequency comb, metrology

Citation

Coddington, I. , Giorgetta, F. , Baumann, E. , Swann, W. and Newbury, N. (2011), Rapid, high resolution frequency comb measurements, Advanced Solid-State Photonics 2011, Istanbul , -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907399 (Accessed March 3, 2024)
Created February 13, 2011, Updated December 29, 2017