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PUBLICATIONS

Confidence in VNA Measurements – The ARFTG Measurement Comparison Program

Published

Author(s)

Ronald A. Ginley

Abstract

This paper describes the ARFTG scattering parameter Measurement Comparison Program (MCP) which is supported by NIST. The ARFTG MCP is designed specifically to allow users of vector network analyzers to compare their measurements to those of their peers. The paper describes the purpose of the ARFTG MCP, what the MCP actually is with regards to devices, measurements and data processing, a brief history of the ARFTG MCP and finally a discussion of the data analysis and presentation methods used by the MCP.
Proceedings Title
Proceedings of the 2011 Measurement Science Conference
Conference Dates
March 14-18, 2011
Conference Location
Pasedena, CA
Pub Type
Conferences

Keywords

ARFTG, measurement comparison, scattering parameters, vector analyzer
Electromagnetics

Citation

Ginley, R. (2011), Confidence in VNA Measurements – The ARFTG Measurement Comparison Program, Proceedings of the 2011 Measurement Science Conference, Pasedena, CA (Accessed March 18, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 14, 2011, Updated January 27, 2020