Confidence in VNA Measurements The ARFTG Measurement Comparison Program
Ronald A. Ginley
This paper describes the ARFTG scattering parameter Measurement Comparison Program (MCP) which is supported by NIST. The ARFTG MCP is designed specifically to allow users of vector network analyzers to compare their measurements to those of their peers. The paper describes the purpose of the ARFTG MCP, what the MCP actually is with regards to devices, measurements and data processing, a brief history of the ARFTG MCP and finally a discussion of the data analysis and presentation methods used by the MCP.
Proceedings of the 2011 Measurement Science Conference