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Conferences

VM Leakage and Orphan Control in Open-Source Clouds

Author(s)
Christopher E. Dabrowski, Kevin L. Mills
Computer systems often exhibit degraded performance due to resource leakage caused by erroneous programming or malicious attacks, and computers can even crash...

Evaluation of Proposed Test Artifacts for Five-Axis Machine Tools

Author(s)
Shawn P. Moylan, David Blumenfeld, Michael L. McGlauflin, Ronnie R. Fesperman Jr., M A. Donmez
Machining of a test artifact is an attractive method of evaluating the performance of a machine tool because the tests are often quick and do not require...

The Development of an Aerodynamic Shoe Sampling System

Author(s)
Matthew E. Staymates, Jessica M. Grandner, John G. Gillen, Stefan Lukow
In collaboration with the Transportation Security Laboratory, the National Institute of Standards and Technology has been developing a prototype shoe sampling...

NON-CONTACT DIMENSIONAL MEASUREMENTS OF BIPOLAR FUEL CELL PLATES

Author(s)
Balasubramanian Muralikrishnan, Wei Ren, Dennis S. Everett, Eric S. Stanfield, Theodore D. Doiron
Non-contact dimensional measurement of fuel cell plates is critical to the eventual rapid manufacture by supporting in-process measurement and control. This...

New Improved System for WWVB Broadcast

Author(s)
John P. Lowe, Matthew J. Deutch, Glenn K. Nelson, Douglas D. Sutton, William C. Yates, Peder Hansen, Oren Eliezer, Tom Jung, Stephen Morrison, Yingsi Liang, Dinesh Rajan, Sidharth Balasubramanian, Arun Ramasami, Waleed Khalil
The WWVB broadcast of the time-code signal has not undergone major changes in its communications protocol and modulation scheme since its introduction in 1963...

Improvements to A Transportable Atomic Fountain Laser system

Author(s)
Paul D. Kunz, Vladislav Gerginov, Thomas P. Heavner, Steven R. Jefferts
We are developing a transportable rubidium (Rb) atomic fountain frequency standard which uses independently phase-locked diode lasers for laser-cooling. At this...

Characterizing Dynamic Effects of Oscillator Power Cycling

Author(s)
David A. Howe, Danielle G. Lirette, Neil Ashby, Archita Hati, Craig W. Nelson
We create a measurement technique and metrics consistent with easy interpretation to be used in development of new oscillators specifically for applications in...

Fundamental Limits of Optical Patterned Defect Metrology

Author(s)
Richard M. Silver, Bryan Barnes, Martin Sohn, Hui Zhou, Jing Qin
The semiconductor manufacturing industry is now facing serious challenges in achieving defect detection rates with acceptable throughput and accuracy. With...

Uncertainties of Measures in Speaker Recognition Evaluation

Author(s)
Jin Chu Wu, Alvin F. Martin, Craig S. Greenberg, Raghu N. Kacker
The National Institute of Standards and Technology (NIST) Speaker Recognition Evaluations (SRE) are an ongoing series of projects conducted by NIST. In the NIST...

Reliability Testing of Advanced Interconnect Materials

Author(s)
Robert R. Keller, Mark C. Strus, Ann C. Chiaramonti Debay, David T. Read, Younglae Kim, Yung J. Jung
We describe the development of electrical test methods to evaluate damage that determines reliability in advanced, small-scale conductors, including damascene...
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