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Conferences

When Does a Circuit Really Fail?

Author(s)
Jason T. Ryan, Lan Wei, Jason P. Campbell, Richard G. Southwick, Kin P. Cheung, Tony Oates, Phillip Wong, John S. Suehle

Energy Efficiency Analysis for a Casting Production System

Author(s)
Jonatan K. Berglund, John L. Michaloski, Swee K. Leong, Guodong Shao, Frank H. Riddick, Jorge Arinez, Stephan Biller
A growing number of manufacturing industries are initiating efforts to address sustainability issues. A study by the National Association of Manufacturers...

Graphene: Plane and Simple Electrical Metrology?

Author(s)
Randolph Elmquist, Felipe Hernandez-Marquez, Mariano Real, Tian T. Shen, David Newell, Colin J. Jacob, George R. Jones Jr.
The development of large-area graphene has direct application to electrical standards including the quantized Hall resistance because of unique characteristics...

Versus: A Framework for General Content-Based Comparisons

Author(s)
Peter Bajcsy, Antoine Vandecreme, Benjamin J. Long, Paul Khouri Saba, Joe Chalfoun, Luigi Marini, Devin Bonnie, Rob Kooper, Michal Ondrejcek, Kenton McHenry
Abstract—We present a framework for the execution and dissemination of customizable content-based file comparison methods. Given digital objects such as files...

The New SI: The Role of CODATA

Author(s)
David B. Newell, Peter J. Mohr, Barry N. Taylor
The mission of the International Council for Science : Committee on Data for Science and Technology (CODATA ) is to strengthen international science for the...

Objective Evaluation of Imager Performance

Author(s)
Francine K. Amon, Dennis D. Leber, Nicholas Paulter
We describe a method by which the evaluation and characterization of the performance of an imager can be done objectively and scientifically, that is, without...

Comparing VM-Placement Algorithms for On-Demand Clouds

Author(s)
Kevin L. Mills, James J. Filliben, Christopher E. Dabrowski
Much recent research has been devoted to investigating algorithms for allocating virtual machines (VMs) to physical machines (PMs) in infrastructure clouds...

VM Leakage and Orphan Control in Open-Source Clouds

Author(s)
Christopher E. Dabrowski, Kevin L. Mills
Computer systems often exhibit degraded performance due to resource leakage caused by erroneous programming or malicious attacks, and computers can even crash...

Evaluation of Proposed Test Artifacts for Five-Axis Machine Tools

Author(s)
Shawn P. Moylan, David Blumenfeld, Michael L. McGlauflin, Ronnie R. Fesperman Jr., M A. Donmez
Machining of a test artifact is an attractive method of evaluating the performance of a machine tool because the tests are often quick and do not require...

The Development of an Aerodynamic Shoe Sampling System

Author(s)
Matthew E. Staymates, Jessica M. Grandner, John G. Gillen, Stefan Lukow
In collaboration with the Transportation Security Laboratory, the National Institute of Standards and Technology has been developing a prototype shoe sampling...
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