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Testing Passive UHF Tag Performance Evolution

Published

Author(s)

Daniel G. Kuester, David R. Novotny, Jeffrey R. Guerrieri, Zoya Popovic

Abstract

Trends in tag development since the introduction of the ISO 18000-6C and EPC Global standards are investigated empirically with measurements of power harvesting and backscattering performance from 20 samples of passive tags across 860-960MHz. The population spans ages of 0 to 6 years, 9 tag manufacturers, and 3 chip manufacturers. All tags were still in working condition, except two 5-year-old tags that no longer responded to interrogations and a 3-year-old tag with a degraded chip-to-antenna bond. Despite steadily improving chips, some older tags show performance comparable to new tags.
Proceedings Title
2011 IEEE International Conference on RFID-Technology and Applications (RFID-TA).
Conference Dates
September 15-16, 2011
Conference Location
Sitges

Citation

Kuester, D. , Novotny, D. , Guerrieri, J. and Popovic, Z. (2011), Testing Passive UHF Tag Performance Evolution, 2011 IEEE International Conference on RFID-Technology and Applications (RFID-TA). , Sitges, -1, [online], https://doi.org/10.1109/RFID-TA.2011.6068600 (Accessed October 10, 2024)

Issues

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Created September 15, 2011, Updated January 27, 2020