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Testing Passive UHF Tag Performance Evolution



Daniel G. Kuester, David R. Novotny, Jeffrey R. Guerrieri, Zoya Popovic


Trends in tag development since the introduction of the ISO 18000-6C and EPC Global standards are investigated empirically with measurements of power harvesting and backscattering performance from 20 samples of passive tags across 860-960MHz. The population spans ages of 0 to 6 years, 9 tag manufacturers, and 3 chip manufacturers. All tags were still in working condition, except two 5-year-old tags that no longer responded to interrogations and a 3-year-old tag with a degraded chip-to-antenna bond. Despite steadily improving chips, some older tags show performance comparable to new tags.
Proceedings Title
2011 IEEE International Conference on RFID-Technology and Applications (RFID-TA).
Conference Dates
September 15-16, 2011
Conference Location


Kuester, D. , Novotny, D. , Guerrieri, J. and Popovic, Z. (2011), Testing Passive UHF Tag Performance Evolution, 2011 IEEE International Conference on RFID-Technology and Applications (RFID-TA). , Sitges, -1, [online], (Accessed June 20, 2024)


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Created September 15, 2011, Updated January 27, 2020