Daniel G. Kuester, David R. Novotny, Jeffrey R. Guerrieri, Zoya Popovic
Trends in tag development since the introduction of the ISO 18000-6C and EPC Global standards are investigated empirically with measurements of power harvesting and backscattering performance from 20 samples of passive tags across 860-960MHz. The population spans ages of 0 to 6 years, 9 tag manufacturers, and 3 chip manufacturers. All tags were still in working condition, except two 5-year-old tags that no longer responded to interrogations and a 3-year-old tag with a degraded chip-to-antenna bond. Despite steadily improving chips, some older tags show performance comparable to new tags.
2011 IEEE International Conference on RFID-Technology and Applications (RFID-TA).
, Novotny, D.
, Guerrieri, J.
and Popovic, Z.
Testing Passive UHF Tag Performance Evolution, 2011 IEEE International Conference on RFID-Technology and Applications (RFID-TA). , Sitges, -1, [online], https://doi.org/10.1109/RFID-TA.2011.6068600
(Accessed January 26, 2022)