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A STANDARD ANALYSIS APPROACH TO DETERMINE PRODUCT APPLICABILITY

Published

Author(s)

Paul W. Witherell, Prabir Sarkar, Anantha Narayanan Narayanan, Jae H. Lee, Sudarsan Rachuri

Abstract

Standards and regulations have become an important part of today’s society. Organizational and geographical dispersions of standards often create situations where manufacturers are forced to meet various standards for a product to reach expanded markets or improve branding. In this paper we propose a product-oriented approach to harmonizing standards. Our approach provides stakeholders with the means to identify similarities and differences between the coverage of standards. Using an analysis based on the Zachman framework, we are able to identify both overlaps and gaps that may transpire when analyzing multiple standards associated with a single product domain. To demonstrate our approach, we apply it to a subset of electronics-related sustainability standards. The results are sets of terms which can be used to define the gaps and overlaps between three standards; RoHS, WEEE, and IEEE P1680. We then discuss some of the challenges encountered when analyzing these standards. Finally, we briefly discuss how this approach can provide a basis for an expanded approach. This expanded approach could assist in the development of domain models and ultimately help identify necessary actions in business processes that will lead to additional standard compliance.
Proceedings Title
Proceedings of the ASME 2011 International Design Engineering Technical Conferences &
Computers and Information in Engineering Conference
IDETC/CIE 2011
August 29-31, 2011, Washington, DC, USA
Conference Dates
August 28-31, 2011
Conference Location
Washington, DC

Keywords

standard analysis, Zachman framework, gaps and overlaps, sustainability

Citation

Witherell, P. , Sarkar, P. , , A. , Lee, J. and Rachuri, S. (2011), A STANDARD ANALYSIS APPROACH TO DETERMINE PRODUCT APPLICABILITY, Proceedings of the ASME 2011 International Design Engineering Technical Conferences & Computers and Information in Engineering Conference IDETC/CIE 2011 August 29-31, 2011, Washington, DC, USA , Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908104 (Accessed April 21, 2024)
Created August 31, 2011, Updated February 19, 2017