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Josh Gordon, David R. Novotny, Jeffrey R. Guerrieri, Jason Coder, Michael Francis
The Antenna Metrology Lab at the National Institute of Standards and Technology in Boulder Colorado has developed a robotically controlled near-field pattern...
Jason Coder, David R. Novotny, Jeffrey R. Guerrieri, Michael H. Francis, Brian C. Stillwell
An improved antenna gain extrapolation measurement is proposed. The improved method consists of a vector network analyzer, a pair of RF optical links, and a...
We present elegant algorithms for fitting a plane, two parallel planes (corresponding to a slot or a slab) or many parallel planes in a total (orthogonal) least...
Edwin J. Heilweil, Paul A. Lane, Okan Esenturk, Paul D. Cunningham, Joseph S. Melinger
Relative carrier mobilities in semiconducting organic polymer films measured using non-contact optical pump terahertz (THz) probe spectroscopy will be presented...
Howard W. Yoon, Gary D. Graham, Robert D. Saunders, Yuqin Zong, Eric L. Shirley
We describe the characterization of a group of NIST spectral irradiance lamps at longer distances and larger angles than are typically issued by NIST. The...
Dong Hun Yeo, Franklin T. Lombardo, Dilip K. Banerjee, Eric J. Letvin, Emil Simiu, Marc L. Levitan, Florian A. Potra
The paper summarizes recent research and development of computer-aided and computational methods in wind engineering at the National Institute of Standards and...
Linbin Yu, Yu Lei, Raghu N. Kacker, D. Richard Kuhn, James F. Lawrence
Combinatorial testing has been shown to be a very effective testing strategy. Most work on combinatorial testing focuses on t-way test data generation, where...
Paulina Kuo, Jason S. Pelc, Oliver T. Slattery, Martin M. Fejer, Xiao Tang
We demonstrate application of a dual-channel upconversion detector as a beamsplitter that preserves photon statistics. We use this beamsplitter to characterize...
Stephen B. Balakirsky, Zeid Kootbally, Craig I. Schlenoff, Thomas R. Kramer, Satyandra K. Gupta
The IEEE RAS Ontologies for Robotics and Automation Working Group is dedicated to developing a methodology for knowledge representation and reasoning in...
Evaluation of aggregation and agglomeration of carbon nanotube (CNT) solution has been one of the key issues for applications. Here we introduce a simple method...
Craig I. Schlenoff, Edson Prestes, Rajmohan Madhavan, Paulo Goncalvest, Howard Li, Stephen B. Balakirsky, Thomas R. Kramer, Emilio Miguelanez
In this article, we discuss a newly formed IEEE- RAS working group entitled Ontologies for Robotics and Automation (ORA). The goal of this working group is to...
Joseph A. Falco, Jeremy A. Marvel, Richard J. Norcross
Robot manufacturers are developing a new generation of industrial robots that are designed to work in collaborative environments in close proximity to humans...
Chukwudi A. Okoro, Jungjoon Ahn, Meagan V. Kelso, Pavel Kabos, Joseph Kopanski, Yaw S. Obeng
In this paper, we will present an overview of metrology issues and some of the techniques currently under development in our group at NIST, aimed at...
Jing Qin, Hui Zhou, Bryan Barnes, Francois R. Goasmat, Ronald G. Dixson, Richard Silver
There has been much recent work in developing advanced optical metrology applications that use imaging optics for optical critical dimension (OCD) measurements...
A network security metric is desirable in evaluating the effectiveness of security solutions in distributed systems. Aggregating CVSS scores of individual...
Comparisons of two microscopy images can be accomplished in many different ways. This paper presents a system that recommends appropriate similarity metrics for...
Peter Bajcsy, Antoine Vandecreme, Benjamin J. Long, Paul Khouri Saba, Joe Chalfoun, Luigi Marini, Rob Kooper, Michal Ondrejcek, Kenton McHenry, Smruti Padhy
Versus is a framework for the execution and dissemination of customizable content-based file comparison methods. Given digital objects such as files, database...
An approach that combines not only the cell manipulation capabilities of dielectrophoresis (DEP), but also the conditions to promote appropriate cell function...
Craig I. Schlenoff, Sebti Foufou, Stephen B. Balakirsky
In this paper, we present initial thoughts on an approach to ontology/logic-based intention recognition based on the recognition, representation, and ordering...
This paper addresses the problem of mapping application specific requirements on image similarity metrics to the plethora of existing image similarity...
Pragya R. Shrestha, Adaku Ochia, Jason P. Campbell, Canute I. Vaz, Jihong Kim, Kin P. Cheung, Helmut Baumgart, Gary Harris
The wide distribution of ON and OFF values and high SET current in resistive memory is attributed to the high current overshoot during the SET process. In this...
Heayoung Yoon, Dmitry A. Ruzmetov, Paul M. Haney, Marina S. Leite, Behrang H. Hamadani, Albert A. Talin, Nikolai B. Zhitenev
We investigate local electronic properties of CdTe solar cells using electron beam to excite electron-hole pairs and evaluate spatially resolved photocurrent...
Zhao Z. Deng, Alexander Smolyanitsky, Qunyang Li, Xi-Qiao Feng, Rachel J. Cannara
We discuss a potential new measurement application based on nanotribological measurements and simulations of the model lamellar material graphite. While...
Edward Garboczi, Dale P. Bentz, Jeffrey M. Davis, Yang Lu
The prediction of the service life of concrete materials is difficult, mainly because of their complex heterogeneous microstructure and their random nature...
Thomas Gerrits, Brice R. Calkins, Nathan A. Tomlin, Adriana E. Lita, Alan L. Migdall, Sae Woo Nam, Richard P. Mirin
Photon number resolving transition-edge sensors (TES) are the cutting-edge enabling technology for high quantum efficiency photon counting when the number of...
Thomas E. Lipe Jr., Piotr S. Filipski, Joseph R. Kinard Jr., Yi-hua D. Tang
We report the results of a comparison of quantum-based AC Josephson Voltage Standards (ACJVS) between the National Institute of Standards and Technology (NIST)...
B. Carol Johnson, Gary D. Graham, Robert D. Saunders, Howard Yoon, Eric Shirley
Scales of spectral irradiance are disseminated from NIST by assignment of values to FEL-type lamp standards for defined conditions. These lamp standards can be...
Heather J. Patrick, Clarence J. Zarobila, Thomas A. Germer, Victor A. Ying, Catherine C. Cooksey, Benjamin K. Tsai
STARR II is a planned NIST facility for spectral measurements of specular reflectance and diffuse bidirectional reflectance distribution function (BRDF) that is...
Full-scale fire experiments were conducted at the National Institute of Standards and Technology (NIST) to investigate tire fire interactions with the passenger...
The relationship between total integrated scatter (TIS) and root mean square (rms) roughness was developed in the radar literature and enabled the first use of...