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Conferences

Nanocrystalline Zinc Oxide Powder for X-ray Diffraction Metrology

Author(s)
David R. Black, Joseph J. Ritter, John E. Bonevich, Albert Henins, James P. Cline
Nano scale zinc oxide powder has been produced using a precise thermal decomposition process from a zinc oxalate precursor powder. The size of the crystallites

Dual-channel, single-photon upconversion detector at 1300 nm

Author(s)
Paulina Kuo, Jason S. Pelc, Oliver T. Slattery, Lijun Ma, Martin M. Fejer, Xiao Tang
We show a dual-channel, upconversion detector at 1.3-m-wavelength based on phasemodulated periodically poled LiNbO3, and use it for wavelength- to time

Does Your SEM Really Tell the Truth?

Author(s)
Michael T. Postek, Andras Vladar
The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many, diverse scientific and industrial

Mobile Application Device Power Usage Measurements

Author(s)
Rahul Murmuria, Jeffrey Medsger, Angelos Stavrou, Jeff Voas
Reducing power consumption has become a crucial design tenet for both mobile and other small computing devices that are not constantly connected to a power

Transition edge sensors with low jitter and fast recovery times

Author(s)
Antia A. Lamas-Linares, Nathan A. Tomlin, Brice R. Calkins, Adriana E. Lita, Thomas Gerrits, Joern Beyer, Richard P. Mirin, Sae Woo Nam
Superconducting transition edge sensors (TES) for single photon detection have been shown to have almost perfect quantum efficiency (98%) at a wide range of

On-chip, photon-number-resolving, telecom-band detectors for scalable photonic information processing

Author(s)
Thomas Gerrits, Nick Thomas-Peter, James Gates, Adriana E. Lita, Benjamin Metcalf, Brice R. Calkins, Nathan A. Tomlin, Anna E. Fox, Antia A. Lamas-Linares, Justin Spring, Nathan Langford, Richard P. Mirin, Peter Smith, Ian Walmsley, Sae Woo Nam
We demonstrate the operation of an integrated photon number resolving transition edge sensor (TES), operating in the telecom band at 1550 nm, employing an

The Date-Time Vocabulary

Author(s)
Mark H. Linehan, Edward J. Barkmeyer Jr., Stan Hendryx
The Date-Time Vocabulary is a new OMG specification that models continuous time, discrete time, the relationship of events and situations to time, language

Information Required for Dimensional Measurement

Author(s)
John A. Horst, Curtis Brown, Robert Brown, Larry Maggiano, K Summerhays, Thomas R. Kramer
Much work has been done by standards organizations to model dimensional measurement information in digital formats, but the work done has revealed that standard

Evolutionary Construction of de Bruijn Sequences

Author(s)
Meltem Sonmez Turan
A binary de Bruijn sequence of order n is a cyclic sequence of period 2^n, in which each n-bit pattern appears exactly once. These sequences are commonly used
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