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A Verification Method for Noise-Temperature Measurements on Cryogenic Low-Noise Amplifiers

Published

Author(s)

Dazhen Gu, Derek A. Houtz, James P. Randa, Dave K. Walker

Abstract

We report a verification method for noise-temperature (NT) measurements on cryogenic low noise amplifiers (LNAs) at liquid helium temperature. The method uses the comparison between the individual measurements of the LNA and an attenuator and the joint measurements of the tandem of the two. As the first step, we were able to determine the loss and the added NT of the cables that connected the cryogenic devices (the LNA, the attenuator, or their combination) to the test ports outside of a cryostat. The attenuator was also characterized successfully with 3% measurement uncertainty.
Conference Dates
July 1-6, 2012
Conference Location
Washington, DC
Conference Title
Conference on Precision Electromagnetic Measurements

Keywords

Cryogenic amplifier, noise measurement, noise temperature, measurement uncertainty, verification methods.

Citation

Gu, D. , Houtz, D. , Randa, J. and Walker, D. (2012), A Verification Method for Noise-Temperature Measurements on Cryogenic Low-Noise Amplifiers, Conference on Precision Electromagnetic Measurements, Washington, DC, [online], https://doi.org/10.1109/CPEM.2012.6250644 (Accessed April 14, 2024)
Created July 1, 2012, Updated November 10, 2018