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Conferences

Reliability Monitoring For Highly Leaky Devices

Author(s)
Jason T. Ryan, Jason P. Campbell, Kin P. Cheung, John S. Suehle, Richard Southwick, Anthony Oates
We demonstrate a new charge pumping (CP) methodology, frequency modulated CP (FMCP), that robustly treats metrology challenges associated with high gate leakage

AlGaAs Composition Standards at NIST

Author(s)
Kristine A. Bertness
High-accuracy comparison standards for Al mole fraction x in AlxGa1–xAs have been available at NIST since 2006 via the Standard Reference Material (SRM) program

Practical Strategies for QKD Key Production

Author(s)
Alan Mink, Anastase Nakassis
We present the quantum key distribution (QKD) secure key ratio expression in a form that exposes the parameters that affect the Reconciliation (error correction

Precision metrology with coherent dual frequency combs

Author(s)
Nathan R. Newbury, Esther Baumann, Ian R. Coddington, Fabrizio R. Giorgetta, Greg B. Rieker, Laura C. Sinclair, William C. Swann, Alexander M. Zolot
Frequency combs have enabled a wide range of applications because of their unique combination of coherence and broad bandwidth. The comb provides 100,000's of

Microfluidic Synthesis of Nano-Liposomal Anesthetics

Author(s)
Wyatt N. Vreeland, Renee R. Hood, Eric Kendall, Mariana Junqueira, Julia Finkel, Don L. DeVoe
Topical anesthesia has the ability to provide painless application of pain management medications for minor procedures such as venipuncture, particularly in the

Metrology for Lab-on-a-Chip Final-Product Devices

Author(s)
Darwin R. Reyes-Hernandez, Michael W. Halter, Jeeseong Hwang
New metrology tools to measure the critical parameters of internal structures in lab on a chip devices are greatly needed in order to develop standard tests for
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