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Conferences

Accurate RRAM Transient Currents during Forming

Author(s)
Pragya R. Shrestha, David M. Nminibapiel, Jason P. Campbell, Jihong Kim, Canute I. Vaz, Kin P. Cheung, Helmut Baumgart
Current overshoot during forming has been shown to be a serious issue. Recently the current overshoot duration has been shown to be an important factor

Bilateral NMI Comparison of Guarded-Hot-Plate Apparatus

Author(s)
Alain Koenen, Robert R. Zarr, William F. Guthrie
Two national metrology laboratories (NMI) have conducted an international interlaboratory comparison on thermal conductivity on two thermal insulation reference

Powder Bed Fusion Machine Performance Testing

Author(s)
Shawn P. Moylan, Joseph Drescher, M A. Donmez
Unlike conventional machining where there is a near 1:1 correspondence of machine performance to the geometry of the workpiece, the accuracy of the machine

Study of Accuracy of Parts Produced Using Additive Manufacturing

Author(s)
Marcin Bauza, Shawn P. Moylan, Robert Panas, Stephen Burke, Harry Martz, John S. Taylor, Paul Alexander, Richard Knebel
The purpose of this presentation is to focus discussion onto the issue of accuracy and uncertainty of parts made with additive manufacturing processes.

Terahertz Active and Passive Imaging

Author(s)
Erich N. Grossman, Joshua A. Gordon, David R. Novotny, Richard A. Chamberlin
We describe the results of bistatic scattering measurements covering 325-650 GHz on a series of wellcharacterized random rough test surfaces. These have

10 nm Three-Dimensional CD-SEM Metrology

Author(s)
Andras Vladar, John S. Villarrubia, Bin Ming, Regis J. Kline, Jasmeet Chawla, Scott List, Michael T. Postek
The shape and dimensions of a challenging pattern have been measured using a model-based library scanning electron microscope (MBL SEM) technique. The sample
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