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NIST Interagency/Internal Report (NISTIR)

Semiconductor Electronics Division

Author(s)
David G. Seiler, Erik M. Secula
This is a high-level, full-color brochure detailing the activities and challenges of the Semiconductor Electronics Division. Topics include Division history

Viewing Technologies for CAD Models

Author(s)
Michelle P. Steves, Simon P. Frechette
This report describes Computer-Aided Design (CAD) model-viewing technologies1 used to support CAD-model review and analysis. CAD model viewers are tools that

Government Smart Card Interoperability Specification, Version 2.1

Author(s)
Teresa T. Schwarzhoff, James F. Dray Jr., John P. Wack, Eric Dalci, Alan H. Goldfine, Michaela Iorga
This Government Smart Card Interoperability Specification (GSC-IS) provides solutions to a number of the interoperability challenges associated with smart card

Missing Data Methods and Toolbox Users Guide

Author(s)
Curtis H. Parks, Gerard N. Stenbakken, Alexei Nikolaev
Measurement data are collected to characterize a production run of devices that can then be analyzed to identify a reduced set of measurement points. Such

Picture Password: A Visual Login Technique for Mobile Devices

Author(s)
Wayne Jansen, Serban I. Gavrila, Vladimir Korolev, Richard P. Ayers, Ryan Swanstrom
Adequate user authentication is a persistent problem, particularly with handheld devices, which tend to be highly personal and at the fringes of an organization

Semiconductor Microelectronics and Nanoelectronics Programs

Author(s)
Stephen Knight, Joaquin (. Martinez, Michele L. Buckley
The microelectronics industry supplies vital components to the electronics industry and to the U.S. economy, enabling rapid imporvements in productivity and in
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