Missing Data Methods and Toolbox Users Guide

Published

July 2, 2003

Author(s)

Curtis H. Parks, Gerard N. Stenbakken, Alexei Nikolaev

Abstract

Measurement data are collected to characterize a production run of devices that can then be analyzed to identify a reduced set of measurement points. Such measurement arrays can contain missing values. Missing data analysis methods are described, together with a graphical toolbox for executing the methods. This Users Guide describes the mathematical techniques and the utility of the toolbox in identifying an optimal approach in using the incomplete information in processes which expect complete information. The resultant measurements are shown to give an improved model of the device.

Citation

NIST Interagency/Internal Report (NISTIR) - 7023

Report Number

7023

NIST Pub Series

NIST Interagency/Internal Report (NISTIR)

Pub Type

NIST Pubs

Keywords

data analysis, device models, missing data

Citation

Parks, C. , Stenbakken, G. and Nikolaev, A. (2003), Missing Data Methods and Toolbox Users Guide, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed October 16, 2025)