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Missing Data Methods and Toolbox Users Guide

Published

Author(s)

Curtis H. Parks, Gerard N. Stenbakken, Alexei Nikolaev

Abstract

Measurement data are collected to characterize a production run of devices that can then be analyzed to identify a reduced set of measurement points. Such measurement arrays can contain missing values. Missing data analysis methods are described, together with a graphical toolbox for executing the methods. This Users Guide describes the mathematical techniques and the utility of the toolbox in identifying an optimal approach in using the incomplete information in processes which expect complete information. The resultant measurements are shown to give an improved model of the device.
Citation
NIST Interagency/Internal Report (NISTIR) - 7023
Report Number
7023

Keywords

data analysis, device models, missing data

Citation

Parks, C. , Stenbakken, G. and Nikolaev, A. (2003), Missing Data Methods and Toolbox Users Guide, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 1, 2003, Updated October 12, 2021