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Semiconductor Electronics Division

Published

Author(s)

David G. Seiler, Erik M. Secula

Abstract

This is a high-level, full-color brochure detailing the activities and challenges of the Semiconductor Electronics Division. Topics include Division history, nanotechnology, MEMS, electrical test structures, power electronics, optical and electrical measurements, gate dielectrics, and super transistors.
Citation
NIST Interagency/Internal Report (NISTIR) -

Keywords

mems, nanotechnology, semiconductor, test structures, transistors

Citation

Seiler, D. and Secula, E. (2003), Semiconductor Electronics Division, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed April 24, 2024)
Created September 29, 2003, Updated October 12, 2021