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Projects/Programs

Displaying 1 - 25 of 99

Advanced High Frequency Devices

The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at high

Advanced Materials Metrology

In this project we measure the fundamental electrical properties of materials from bulk to nanoscale from 1 MHz to 0.3 THz. Understanding the interaction of

Advanced Microwave Photonics

Research on quantum information (QI) seeks to control and exploit exotic properties of quantum mechanics, and researchers are already generating "unbreakable"

Advancing PEEM-based Metrology

Specialized imaging methods with high spatial resolution are essential for advancing the physical understanding of emergent materials in advanced electronics

Amplifiers

To process quantum information it is important to have amplifiers with wide bandwidth, high dynamic range, and low noise.

Atom-Based Dimensional Metrology

To fabricate and measure solid state implementations of manufacturable atomically precise devices. Build the infrastructure to fabricate prototype few-atom

Atomic-force microscopy

Atomic-force microscopy is a reference method for traceable and correlative measurements of nanostructures. The Nanostructure Fabrication and Measurement Group

Biomolecular assembly

Biomolecular assembly allows the integration of nanoscale components into functional nanostructures. The Nanostructure Fabrication and Measurement Group

Computational Micromagnetics

NIST researchers develop simulation tools to support modeling, measurement and fundamental understanding of micromagnetic physics.

Diamond NV Center Magnetometry

The nitrogen-vacancy (NV) center in diamond has emerged in the last decade as the most exciting new technology for nanoscale magnetic measurements. By