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Electronics

Semiconductors

Projects/Programs

Keyword

Organizational Unit

Standardizing New Materials, Processes, and Equipment for Microelectronics

Ongoing

Semiconductor measurement labs struggle to measure Scattering (S-) parameters—how electrical signals travels through and reflect off—of integrated circuits

Strain Measurement for Semiconductor Devices

Ongoing

Our objective is to develop metrology techniques for characterizing mechanical strain in semiconductor devices as well as reference materials for assessing the

Images depicting an advanced analysis of HR-EBSD data

Strain Measurement for Semiconductor Devices and Packages

Ongoing

Mechanical strain impacts the performance of semiconductor devices. Manufacturing processes must be carefully controlled for strain to achieve high-yield and

Sub-nanoscale electron microscopy of complex nanostructures

Ongoing

The aim of this project is to develop robust, quantitative measurement methods utilizing transmission electron microscopy methods for complex, nanostructured

Fig. 1. Time re-Envisioned: Not a biproduct of computation but the domain in which information is encoded. Leads to different mathematical functions becoming energy efficient primitives.

Temporal Computing

Ongoing

The human brain does some types of information processing, like speech recognition, image recognition, or video processing, much more efficiently than can be

Theory and Modeling of Materials for Renewable Energy

Ongoing

Renewable energy sources such as solar energy are attractive alternatives to fossil fuels because of their abundant supply and pollution-free power generation

Theory of the optical properties of materials

Ongoing

The overarching objective of this project is reliably calculating the bulk optical properties of materials, such as complex index of refraction, absorption, and

Thermoreflectance Thermal Property Measurements for Heterogeneously Integrated Materials and Power Electronics

Ongoing

The thermal properties of materials and interfaces that govern the performance, reliability, and thermal management in microelectronics packages and wide

Thin Film Electronics (Archived)

Completed

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and innovation of

Time-resolved Emission Microscopy for Circuit Evaluation and Failure Analysis

Ongoing

Time-resolved-emission microscopy (TREM) is a workhorse of semiconductor circuit evaluation. However, as transistor dimensions and power-supply voltages have

Training and optimization of hardware neural networks

Ongoing

Machine learning and artificial intelligence (AI) have advanced so rapidly that they can now outperform humans at many (or even most) tasks. However, the large

SRM 3452 certified Seebeck coefficient data

Transport Property Measurements for Semiconductors and Energy Materials

Ongoing

Develop critical thermal and electrical transport measurement methods, instrumentation, and reference materials needed to support the development, performance

NIST Headquarters
-Creating Helpful Incentives to Produce Semiconductors for America (CHIPS)
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