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Electronics

Projects/Programs

Keyword

Organizational Unit

Single Photonics and Quantum Information

Ongoing

One of the activities in this group is the development of single photon technologies for quantum information science and technology. We work closely with the Nanostructure Fabrication and Metrology Project on the generation of novel non-classical states of light and the detection of single photons...

Cross section of a SAC solder joint in a BGA, with sketches of potential micro specimens

Small Scale Mechanical Testing

Ongoing

Knowledge of a material’s mechanical properties is key to designing safe and reliable structural components for applications ranging in size from medical implants to large civil engineering structures. Traditionally, a material’s mechanical properties are measured by performing mechanical tests on...

Smart Grid Communication Networks

Completed

Objective: To accelerate the development of scalable, reliable, secure, and interoperable communications and standards for smart grid applications; and to enable informed decision making by smart grid operators by developing measurement science-based guidelines and tools. What is the new technical...

Smart Grid Interoperability Testbed Facility

Ongoing

Objective - To develop and progress an advanced multi-mode interacting measurement testbed that leverage cross-OU expertise to facilitate implementation, validation, and full characterization of smart grid interoperability standards and smart grid performance, with a particular emphasis on DER...

Individual quantum center creation, characterization, quantum control, efficient collection and readout.

Spectroscopy and Application of Solid-State Quantum Centers

Ongoing

Quantum color centers in wide-bandgap semiconductors have spin and optical degrees of freedom, which can be leveraged for applications such as sensing and single-photon generation. In materials like diamond and silicon carbide, long spin lifetimes and quantum coherence times enable sensitive...

Standards Development to Ensure Reliable Breath Analysis in the Field

Ongoing

Numerous volatile organic compounds (VOCs) have been identified in human breath. These compounds can be produced by the body or by organisms in the body (e.g., bacteria or viruses) and provide a non-invasive window into human health. Inexpensive point-of-care devices are being developed to diagnose...

Images depicting an advanced analysis of HR-EBSD data

Strain Measurement for Semiconductor Devices and Packages

Ongoing

Strain is a critical parameter that influences both electrical and mechanical failures of devices, however, measuring strain in complex 3D geometries and vanishingly small feature sizes remains a challenge for manufacturers. Data provided by strain measurements can be used to validate computational...

Strain Measurement for Semiconductor Devices

Ongoing

Mechanical strain is hugely important to semiconductor devices and packages while also being difficult to measure accurately. Strain is engineered into CMOS channels to improve carrier mobility for higher performance at lower power but is also intrinsically present from manufacturing processes where...

Submillimeter Wave Probing: Pushing High-Speed Metrology toward One Terahertz

Ongoing

Traditional on-wafer measurement platforms at microwave and radio frequencies rely on probes that make electrical contact to devices under test (DUTs) through direct, mechanical contact. Because of their small dimensions, contact measurement probes in the submillimeter regime are likely to be...

Fig. 1. Time re-Envisioned: Not a biproduct of computation but the domain in which information is encoded. Leads to different mathematical functions becoming energy efficient primitives.

Temporal Computing

Ongoing

In standard integrated circuits, information that is coded as ones and zeros is implemented by voltages on wires being high or low. The circuits consume energy during transitions between these voltages. Binary numbers have a voltage per bit so there are a lot of transitions each time a number...

Passive millimeter-wave image of concealed contraband (handgun and ceramic knife).

Terahertz Imaging and Sources

Ongoing

Over the past several years, we have focused on bolometric detection of THz radiation. Our initial work on cryogenic detectors has been extended to antenna-coupled bolometers operating at room temperature. These detectors provide a rugged, low-cost alternative for homeland security applications; e.g...

Thermoelectric Measurements

Ongoing

Thermoelectric effects enable the inter-conversion of thermal and electrical energy, with applications that include solid-state waste heat recovery in engines for automotive and industrial manufacturing; power generation for aerospace, non-terrestrial exploration, and remote sensing; and...

Thermoreflectance Thermal Property Measurements for Heterogeneously Integrated Materials and Power Electronics

Ongoing

Thermal conductivity, heat capacity, and interface conductance are fundamental properties that govern semiconductor microelectronic devices, from materials discovery, to design and modeling, thermal management and device performance, and ultimately device reliability and operational lifespan. These...

Thin Film Electronics (Archived)

Completed

Today's electronics have reached a point where sheer computation power has yielded to combined form and function as the key driver of large consumer markets. The demand for portable and pervasive electronics with greater functionality promises significant changes over the next decades in how society...

Thin Film RGTMs

Ongoing

Research Grade Test Materials (RGTMs) are a type of pre-standard developed by NIST as part of the development of Standard Reference Materials and as feedstock for Interlaboratory Studies. NIST is producing a series of thin film RGTMs for use in thin film characterization inter-comparison and as...

Three-Dimensional Nanometer Metrology

Ongoing

Important physical and chemical properties of nanometer scale devices and structures depend on their shape and size. The benefits of nano are already increasing many applications, and are expected to grow significantly. For these applications, measurement accuracy is a fundamental measurement...

Time-resolved Emission Microscopy for Circuit Evaluation and Failure Analysis

Ongoing

When a new integrated circuit is fabricated, it is necessary to measure the chip with microscopy techniques such as photon emission microscopy, which look at infrared photons emitted by electrons accelerated in transistor channels. TREM, also referred to as picosecond imaging circuit analysis, is a...

Training and optimization of hardware neural networks

Ongoing

The goal of this project is to develop a general method that can train many different types of neural networks, and to demonstrate and evaluate their performance on new emerging hardware. We aim to develop and demonstrate training on diverse hardware platforms, and in the presence of realistic noise...

Exploded cross section diagram representing the simplified structure layers in a MOSFET transistor.

Transport Property Measurements for Semiconductors and Energy Materials

Ongoing

The image above is an exploded cross section diagram representing the simplified structure layers in a MOSFET transistor. Thermoreflectance (TR) laser-based measurement techniques, a key focus of this project, can measure the thermal properties of substrates, thin films, multilayer structures, and...

Ultrafast Spectroscopy to Advance Microelectronics

Ongoing

Continued advancement in microelectronics, including analog and digital electronics, power electronics, optics and photonics, and micromechanics for memory, processing, sensing, and communications as defined by the OSTP “National Strategy on Microelectronics Research,” requires knowledge of material...

Universal Microscopy Standards

Ongoing

Microscopy standards that are available today have inadequate performance characteristics. As device linewidths decrease toward physical limits, the international roadmap of devices and systems (IRDS) has set uncertainty targets by the year 2025. This target is hard to hit, challenging the industry...

Waveform Measurements of Radars Operating in the 3.5 GHz Band

Ongoing

This NASCTN effort is coordinated with the Department of Defense (DOD), and the results of this project will support the spectrum regulators as they develop a certification process for Spectrum Access Systems (SAS) and the associated Environmental Sensing Capability (ESC) that may be deployed in...

Waveform Metrology Project

Ongoing

Optical measurement techniques: NIST uses the electro-optic sampling (EOS) technique to measure the vector response of photodiodes and provide phase traceability for commercial instrumentation, such as large-signal network analyzers, lightwave component analyzers, vector signal analyzers...

Wireless Systems Metrology

Ongoing

The Wireless Systems Metrology Program supports the growing wireless industry by developing methods to test the operation and functionality of wireless devices in the presence of various types of distortion. This includes multipath distortion, ranging from a line-of-sight environment (low-multipath)...

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