Tech-X Corporation will develop a signoff tool for photonic integrated circuits (PICs) that accounts for manufacturing variations and imperfections; such as non-vertical side walls or line edge roughness; expected from the fabrication to enable faster development of photonic integrated circuits.
The Tech-X simulation tool XSim will be modified to account for manufacturing variations and imperfections arising from manufactured photonic devices and their metrology data.
The tool will better understand and predict the effects of manufacturing defects on photonics integrated circuits, allowing for reduced cost and faster development times.
The designers of photonic integrated circuits, who will have faster development times as well as U.S. Semiconductor manufacturers and fabrication facilities that will become more competitive by better servicing their customers.
The recipient plans to subaward funds for workflow management for IP, knowledge of foundry practices, and aid in managing the metrology data.
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