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Search Publications by: Jeffrey Jargon (Fed)

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Displaying 1 - 25 of 120

Physical Models and Dimensional Traceability of 2.4 mm Coaxial Airline Standards for Determining Systematic Uncertainties of Calibrated Scattering-Parameters

July 6, 2023
Jeffrey Jargon, Dylan Williams, Angela Stelson, Chris Long, Aaron Hagerstrom, John R. Stoup, Eric S. Stanfield
In this report, we document the models and dimensional traceability of our 2.4 mm coaxial airline standards for performing multiline thru-reflect-line calibrations up to 50 GHz using vector network analyzers. We identify the equations used in our models of

IMS2022 Panel Sessions

April 8, 2022
Jeffrey Jargon, Jasmin Grosinger, Mona Hella
The panel sessions at this year's IEEE International Microwave Symposium (IMS) Week have been put together to cover the broad range of topics and events spanning the week. These sessions are scheduled during lunch breaks.

2022 Spring/Summer ARFTG Microwave Measurement Conference

April 4, 2022
Jon Martens, Andrej Rumiantsev, Marco De Spirito, Jeffrey Jargon
The Automatic RF Techniques Group (ARFTG) is a technical organization interested in all aspects of RF and microwave test and measurement. Originally created as a users' forum focused on the calibration and automation of early vector network analyzers

Quantifying Receiver Nonlinearities in VNA Measurements for the WR-15 Waveguide Band

March 15, 2022
Angela Stelson, Aaron Hagerstrom, Jeffrey Jargon, Chris Long
Scattering (S-) parameters are fundamental to numerous microwave quantities including antenna factors, microwave power, and phase. The uncertainty in S-parameter measurements is influenced by the test setup, including instrument noise, drift, position of

A Robust Algorithm for PAM4 Eye-Diagram Analysis

December 20, 2021
Jeffrey Jargon, Jerome Cheron
We propose a new approach for analyzing PAM4 (pulse amplitude modulation 4-level) eye diagrams that always provides a unique solution by making use of a K-Means algorithm in conjunction with a robust, shortest interval location estimator. Our motivation

Updates to the traceability of mm-wave power measurements at NIST

December 17, 2021
Aaron Hagerstrom, Angela Stelson, Jeffrey Jargon, Chris Long
Metrological traceability helps ensure the reliability of measurements by allowing them to be compared with established international standards with well-understood uncertainties. A thorough uncertainty analysis is therefore necessary to provide traceable

Noise Influence on Scattering-Parameter Measurements

November 4, 2020
Dazhen Gu, Jeffrey A. Jargon, Matthew J. Ryan, Anouk Hubrechsen
We present a general model of noise-influenced scattering (S) parameter measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise appears like a complex Gaussian quotient. The statistical analysis of

Ultrafast waveform metrology: A first international comparison

August 24, 2020
Mark Bieler, Paul Struszewski, Ari Feldman, Jeffrey Jargon, Paul D. Hale, Pengwei Gong, Wen Xie, Chuntao Yang, Zhigang Feng, Kejia Zhao, Zhijun Yang
We report on the first international comparison in ultrafast waveform metrology. To this end, the frequency and time responses of a photodiode with a nominal bandwidth of 100 GHz have been measured by several National Metrology Institutes during the last

Physical Models and Dimensional Traceability of WR15 Rectangular Waveguide Standards for Determining Systematic Uncertainties of Calibrated Scattering-Parameters

August 10, 2020
Jeffrey A. Jargon, Dylan F. Williams, Angela C. Stelson, Christian J. Long, Aaron M. Hagerstrom, Paul D. Hale, John R. Stoup, Eric S. Stanfield, Wei Ren
In this report, we document the models and dimensional traceability of our WR15 rectangular waveguide standards for performing multiline thru-reflect-line calibrations from 50 GHz to 75 GHz using vector network analyzers. We identify the equations used in

Precision Millimeter-Wave Modulated Wideband Source for Over-The-Air Reference at 92.4 GHz

April 22, 2020
Paritosh Manurkar, Robert D. Horansky, Benjamin F. Jamroz, Jeffrey A. Jargon, Dylan F. Williams, Catherine A. Remley
As the next generation communications technology continues to evolve to utilize millimeter-wave frequencies, calibration methods are needed for the nonidealities related to these frequencies in communications electronics. In this work, we demonstrate a 1

Channel Sounder Measurement Verification: Conducted Tests

April 15, 2020
Jeanne T. Quimby, Jeffrey A. Jargon, Rodney W. Leonhardt, Jake D. Rezac, Paul D. Hale, Catherine A. Remley, Amanda A. Koepke, Robert Johnk, chriss Hammerschmidt, Paul Mckenna, Irena Stange, Mike Chang
Channel modeling often provides a basis for the design and deployment of wireless technology. Engineers design systems to operate under certain expected channel conditions. Channel models are typically based on the statistics of a collection of many

Verifying the Performance of a Correlation-Based Channel Sounder in the 3.5 GHz Band with a Calibrated Vector Network Analyzer

December 12, 2019
Jeffrey A. Jargon, Jeanne T. Quimby, Catherine A. Remley, Amanda A. Koepke, Dylan F. Williams
We verified the performance of a correlation-based channel sounder in the 3.5 GHz band with a calibrated vector network analyzer by comparing measurements in a stable, coaxial environment at the same reference planes. The purpose of this experiment was to

Quantifying Variance Components for Repeated Scattering-Parameter Measurements

November 30, 2017
Amanda Koepke, Jeffrey Jargon
We quantify random uncertainties for scattering-parameters repeatedly measured with a vector network analyzer (VNA), focusing on variations due to multiple calibrations, disconnects, and repeat measurements. We describe a two-stage nested design, which