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Quantifying Noise Floor and Trace Noise in VNA Measurements for the WR-15 Waveguide Band

Published

Author(s)

Aaron Hagerstrom, Angela Stelson, Jeffrey Jargon, Chris Long

Abstract

We present a model and measured data to assess the uncertainties in scattering-parameter measurements due to noise floor and trace noise in the receivers of a vector network analyzer operating in the WR-15 waveguide band
Proceedings Title
2022 98th ARFTG Microwave Measurement Conference (ARFTG)
Conference Dates
January 17-18, 2022
Conference Location
Las Vegas, NV, US

Keywords

Scattering measurement, model, noise floor, trace noise, uncertainty, vector network analyzer, waveguide

Citation

Hagerstrom, A. , Stelson, A. , Jargon, J. and Long, C. (2022), Quantifying Noise Floor and Trace Noise in VNA Measurements for the WR-15 Waveguide Band, 2022 98th ARFTG Microwave Measurement Conference (ARFTG), Las Vegas, NV, US, [online], https://doi.org/10.1109/ARFTG52954.2022.9844076, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=933578 (Accessed July 15, 2024)

Issues

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Created August 1, 2022, Updated December 22, 2023