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Updates to the traceability of mm-wave power measurements at NIST



Aaron Hagerstrom, Angela Stelson, Jeffrey Jargon, Chris Long


Metrological traceability helps ensure the reliability of measurements by allowing them to be compared with established international standards with well-understood uncertainties. A thorough uncertainty analysis is therefore necessary to provide traceable measurements. In this paper, we summarize recent updates to the measurement procedures and uncertainty analysis for NIST's calibrations of power sensors with WR-15 connectors. The improvements include a more detailed uncertainty analysis with a more complete treatment of type A uncertainty, and the establishment of traceability of DC voltage measurements and scattering parameter measurements to primary standards.
Proceedings Title
97th ARFTG Microwave Measurement Conference
Conference Dates
June 11, 2021
Conference Location
Atlanta, GA, US


Traceability, mm-wave power measurements


Hagerstrom, A. , Stelson, A. , Jargon, J. and Long, C. (2021), Updates to the traceability of mm-wave power measurements at NIST, 97th ARFTG Microwave Measurement Conference, Atlanta, GA, US, [online],, (Accessed May 30, 2024)


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Created December 17, 2021, Updated November 29, 2022