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Noise Influence on Scattering-Parameter Measurements



Dazhen Gu, Jeffrey A. Jargon, Matthew J. Ryan, Anouk Hubrechsen


We present a general model of noise-influenced scattering (S) parameter measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise appears like a complex Gaussian quotient. The statistical analysis of the residual error is given and various statistical quantities and distributions are derived. Experiments were conducted on a two-port VNA to validate the noisy S-parameter model. It was shown that the uncertainty due to the noise is often critical in S-parameter measurements, in particular for S-parameters of a small magnitude.
IEEE Transactions on Microwave Theory and Techniques


Network analysis, noise, probability distribution, random variable, scattering parameter, uncertainty.


Gu, D. , Jargon, J. , Ryan, M. and Hubrechsen, A. (2020), Noise Influence on Scattering-Parameter Measurements, IEEE Transactions on Microwave Theory and Techniques (Accessed April 20, 2024)
Created November 3, 2020, Updated November 4, 2020