Gu, D.
, Jargon, J.
, Ryan, M.
and Hubrechsen, A.
(2020),
Noise Influence on Scattering-Parameter Measurements, IEEE Transactions on Microwave Theory and Techniques
(Accessed October 27, 2025)
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Noise Influence on Scattering-Parameter Measurements
Published
Author(s)
, , , Anouk Hubrechsen
Abstract
We present a general model of noise-influenced scattering (S) parameter measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise appears like a complex Gaussian quotient. The statistical analysis of the residual error is given and various statistical quantities and distributions are derived. Experiments were conducted on a two-port VNA to validate the noisy S-parameter model. It was shown that the uncertainty due to the noise is often critical in S-parameter measurements, in particular for S-parameters of a small magnitude.Citation
IEEE Transactions on Microwave Theory and Techniques
Pub Type
Journals
Keywords
Network analysis, noise, probability distribution, random variable, scattering parameter, uncertainty.
Citation
Issues
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Created November 3, 2020, Updated November 4, 2020