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Search Publications by: Erik M. Secula (Fed)

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Displaying 1 - 20 of 20

Frontiers of Characterization and Metrology for Nanoelectronics: 2017

March 20, 2017
Erik M. Secula, David G. Seiler
The 2017 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) has the goal of bringing together scientists and engineers interested in all aspects of the characterization and measurement technology needed for

EEEL Technical Accomplishments

March 30, 2009
Erik M. Secula
This document describes the technical work of the Electronics and Electrical Engineering Laboratory. In this report, you will find that EEEL researchers are developing the world's most advanced sensors, providing advanced gamma ray imagers for astronomical

Round Robin for Standardization of MEMS Length and Strain Measurements

July 12, 2004
Janet M. Cassard, Erik M. Secula, J Huang
A microelectromechanical systems (MEMS) Length and Strain Round Robin is underway to compare results of in-plane length measurements, residual strain measurements, and strain gradient measurements at a number of laboratories. The goal of this round robin

Semiconductor Electronics Division

September 30, 2003
David G. Seiler, Erik M. Secula
This is a high-level, full-color brochure detailing the activities and challenges of the Semiconductor Electronics Division. Topics include Division history, nanotechnology, MEMS, electrical test structures, power electronics, optical and electrical