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Frontiers of Characterization and Metrology for Nanoelectronics: 2007

Published

Author(s)

David G. Seiler, Alain C. Diebold, Robert McDonald, C M. Garner, Dan Herr, Rajinder P. Khosla, Erik M. Secula
Citation
Frontiers of Characterization and Metrology for Nanoelectronics
Volume
931
Publisher Info
American Institute of Physics, Melville, NY

Citation

Seiler, D. , Diebold, A. , McDonald, R. , Garner, C. , Herr, D. , Khosla, R. and Secula, E. (2007), Frontiers of Characterization and Metrology for Nanoelectronics: 2007, American Institute of Physics, Melville, NY (Accessed July 23, 2024)

Issues

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Created September 30, 2007, Updated January 27, 2020