Seiler, D.
, Diebold, A.
, McDonald, R.
, Garner, C.
, Herr, D.
, Khosla, R.
and Secula, E.
(2007),
Frontiers of Characterization and Metrology for Nanoelectronics: 2007, American Institute of Physics, Melville, NY
(Accessed March 13, 2025)
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Frontiers of Characterization and Metrology for Nanoelectronics: 2007
Published
Author(s)
, Alain C. Diebold, Robert McDonald, C M. Garner, Dan Herr, Rajinder P. Khosla,
Citation
Frontiers of Characterization and Metrology for Nanoelectronics
Volume
931
Publisher Info
American Institute of Physics, Melville, NY
Pub Type
Books
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 30, 2007, Updated January 27, 2020