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PUBLICATIONS

Frontiers of Characterization and Metrology for Nanoelectronics: 2019

Published

Author(s)

Erik M. Secula, David G. Seiler
Proceedings Title
Frontiers of Characterization and Metrology for Nanoelectronics: 2019
Conference Dates
April 2-4, 2019
Conference Location
Monterey, CA
Conference Title
2019 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Pub Type
Conferences

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Citation

Secula, E. and Seiler, D. (2019), Frontiers of Characterization and Metrology for Nanoelectronics: 2019, Frontiers of Characterization and Metrology for Nanoelectronics: 2019, Monterey, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927827 (Accessed April 26, 2024)

Created April 1, 2019, Updated April 2, 2019