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Frontiers of Characterization and Metrology for Nanoelectronics: 2019

Published

Author(s)

Erik M. Secula, David G. Seiler
Proceedings Title
Frontiers of Characterization and Metrology for Nanoelectronics: 2019
Conference Dates
April 2-4, 2019
Conference Location
Monterey, CA
Conference Title
2019 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

Citation

Secula, E. and Seiler, D. (2019), Frontiers of Characterization and Metrology for Nanoelectronics: 2019, Frontiers of Characterization and Metrology for Nanoelectronics: 2019, Monterey, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927827 (Accessed May 10, 2021)
Created April 1, 2019, Updated April 2, 2019