@conference{244576,
  author = {Erik Secula and David Seiler},
  title = {Frontiers of Characterization and Metrology for Nanoelectronics: 2019},
  year = {2019},
  month = {2019-04-01},
  publisher = {Frontiers of Characterization and Metrology for Nanoelectronics: 2019, Monterey, CA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927827},
  language = {en},
}