TY  - CONF
AU  - Erik Secula
AU  - David Seiler
C2  - Frontiers of Characterization and Metrology for Nanoelectronics: 2019, Monterey, CA
DA  - 2019-04-01
LA  - en
PB  - Frontiers of Characterization and Metrology for Nanoelectronics: 2019, Monterey, CA
PY  - 2019
TI  - Frontiers of Characterization and Metrology for Nanoelectronics: 2019
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927827
ER  -