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Frontiers of Characterization and Metrology for Nanoelectronics: 2024

Published

Author(s)

Erik Secula, James Liddle
Proceedings Title
Frontiers of Characterization and Metrology for Nanoelectronics: 2024
Conference Dates
April 15-19, 2024
Conference Location
Monterey, CA, US
Conference Title
2024 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

Keywords

semiconductors, nanoelectronics, metrology

Citation

Secula, E. and Liddle, J. (2024), Frontiers of Characterization and Metrology for Nanoelectronics: 2024, Frontiers of Characterization and Metrology for Nanoelectronics: 2024, Monterey, CA, US (Accessed October 12, 2025)

Issues

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Created December 5, 2024
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