Secula, E.
and Liddle, J.
(2024),
Frontiers of Characterization and Metrology for Nanoelectronics: 2024, Frontiers of Characterization and Metrology for Nanoelectronics: 2024, Monterey, CA, US
(Accessed January 17, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Frontiers of Characterization and Metrology for Nanoelectronics: 2024
Published
Author(s)
,
Proceedings Title
Frontiers of Characterization and Metrology for Nanoelectronics: 2024
Conference Dates
April 15-19, 2024
Conference Location
Monterey, CA, US
Conference Title
2024 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Pub Type
Conferences
Keywords
semiconductors, nanoelectronics, metrology
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 5, 2024