Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Frontiers of Characterization and Metrology for Nanoelectronics: 2011

Published

Author(s)

David G. Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, Erik M. Secula
Citation
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Volume
1395
Publisher Info
American Institute of Physics, Melville, NY

Citation

Seiler, D. , Diebold, A. , McDonald, R. , Chabli, A. and Secula, E. (2011), Frontiers of Characterization and Metrology for Nanoelectronics: 2011, American Institute of Physics, Melville, NY (Accessed July 6, 2022)
Created December 27, 2011, Updated October 12, 2021