Seiler, D.
, Diebold, A.
, McDonald, R.
, Chabli, A.
and Secula, E.
(2011),
Frontiers of Characterization and Metrology for Nanoelectronics: 2011, American Institute of Physics, Melville, NY (Accessed May 16, 2026)
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Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Published
Author(s)
, Alain C. Diebold, Robert McDonald, Amal Chabli,
Citation
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Volume
1395
Publisher Info
American Institute of Physics, Melville, NY
Pub Type
Books
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 27, 2011, Updated October 12, 2021