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Search Publications by: Jan Obrzut (Fed)

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Displaying 26 - 50 of 113

Cure temperature influences electrical properties via carbon nanotube-rich domain formation

July 27, 2016
Author(s)
Chelsea S. Davis, Nathan D. Orloff, Jeremiah W. Woodcock, Christian J. Long, Kevin A. Twedt, Bharath NMN Natarajan, Jonathan E. Seppala, Jabez J. McClelland, Jan Obrzut, James A. Liddle, Jeffrey W. Gilman
Carbon nanotube (CNT) nanocomposites are enticing materials that enable engineers to tailor structural and electrical properties for applications in the automotive and aerospace industries. CNT mass fraction and the matrix cure temperature are two ways to

Multiscale Metrologies for Process Optimization of Carbon Nanotube Polymer Composites

July 18, 2016
Author(s)
Bharath N. Natarajan, Nate Orloff, Rana N. Ashkar, Sagar Doshi, Kevin A. Twedt, Ajay Krishnamurthy, Chelsea S. Davis, Aaron M. Forster, Erik Thostenson, Jan Obrzut, Renu Sharma, James Alexander Liddle
Carbon nanotube (CNT) polymer composites are materials with attractive multifunctional properties that are becoming used in a growing range of commercial applications. With the increasing demand for these materials, it is imperative to develop methods for

A trade-off between the mechanical strength and microwave electrical properties of functionalized and irradiated carbon nanotube sheets

April 4, 2016
Author(s)
Tiffany S. Williams, Nate Orloff, James S. Baker, Sandi G. Miller, Bharath N. Natarajan, Jan Obrzut, Linda S. McCorkle, Marisabel Lebron-Colon, James Gaier, Michael A. Meador, James Alexander Liddle
Carbon nanotube sheets are novel implementation of carbon nanotubes that enable the tailoring of electrical and mechanical properties for applications in the automotive and aerospace industries. Small molecule functionalization and/or post-processing

Surface conductance of graphene from non-contact resonant cavity

March 15, 2016
Author(s)
Jan Obrzut, Caglar Dogu Emiroglu, Oleg A. Kirillov, Yanfei Yang, Randolph E. Elmquist
A method is established to reliably determine surface conductance of single-layer or multi-layer atomically thin nano-carbon graphene structures. These can be synthesized by chemical vapor deposition (CVD), epitaxial growth on silicon carbide (SiC)

Noncontact conductivity and dielectric measurement for high throughput roll-to-roll nanomanufacturing

November 23, 2015
Author(s)
Nathan D. Orloff, Christian J. Long, Jan Obrzut, Laurent Millaud, Francesca Mirri, Thomas R. Kole, Robert D. McMichael, Mattei Pasquali, Stephan J. Stranick, James A. Liddle
Advances in roll-to-roll processing of graphene [1] and carbon nanotube [2] have at last led to the continuous production of high-quality coatings and filaments, ushering in a wave of applications for flexible [3], [4] and wearable [5] electronics, woven

Surface conductance and microwave scattering in semicontinous gold films

September 28, 2015
Author(s)
Jan Obrzut
Semicontinous gold films 4 nm to 12 nm thick were characterized using patterned coplanar waveguides over a frequency range of 100 MHz to 20 GHz. Such films can form two dimensional fractal aggregates mixed with dielectric voids with unusually large

Free Space Microwave Non Destructive Characterization of Composite Materials

May 4, 2015
Author(s)
Jan Obrzut, Ahmed M. Hassan, Edward J. Garboczi
We present a free-space microwave experimental measurement system for the non-destructive testing of composite materials. The system operates in the Q- frequency band of 30 GHz to 50 GHz with fixed wave propagation distance between free-space antennas

Software for Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields*

September 1, 2014
Author(s)
Nathan D. Orloff, Jan Obrzut, Christian J. Long, Thomas F. Lam, Pavel Kabos, David R. Novotny, James C. Booth, James A. Liddle
This software package was developed to analyze microwave cavity perturbation data in order to determine material dielectric properties. Example software is provided to assist with data acquisition and organization. Specifically, it is de-signed to be used

Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields

July 23, 2014
Author(s)
Nathan D. Orloff, Jan Obrzut, Christian J. Long, Thomas F. Lam, James C. Booth, David R. Novotny, James A. Liddle, Pavel Kabos
The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. To

Non-contact Conductance Measurement of Nanosize Objects using Reasonant Cavity

May 15, 2014
Author(s)
Jan Obrzut, Nathan D. Orloff, Oleg A. Kirillov
A cavity perturbation method is used to determine conductance of small volume nano-carbon materials. These are the building blocks of nanostructured materials and devices, and therefore their electrical characteristics are important in the materials

Accelerated Stress Test Assessment of Through-Silicon Vias Using RF Signals

June 1, 2013
Author(s)
Chukwudi A. Okoro, Pavel Kabos, Jan Obrzut, Klaus Hummler, Yaw S. Obeng
In this work, radio frequency (RF) signal is demonstrated as an effective metrology tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity of TSV daisy

Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis

May 28, 2013
Author(s)
Chukwudi A. Okoro, Yaw S. Obeng, Jan Obrzut, Pavel Kabos, Klaus Hummler
In this work, we used radio frequency (RF) based measurement technique is used as a prognostic tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity in

Power Density Rating for Embedded Resistors

July 9, 2012
Author(s)
Jan Obrzut, Jason D. Ferguson, MIchael H. Azarian
The Power Density Ratting (PDR) for Embedded Resistors test method covers procedures for the demonstration of the ability to operate the embedded device safely within nominal tolerance, at rated power, and to withstand the transient voltage waves resulting

Graphene: A New Horizon for Modern Technology

September 15, 2011
Author(s)
Jan Obrzut
Graphene has the potential to improve a long list of daily electronics that are the foundation of the modern computing revolution. In step with research in renewable energy, graphene can and has been used in efficient, flexible solar cells. Crossing the

Springer Handbook of Metrology and Testing, Electrical Properties

August 1, 2011
Author(s)
Jan Obrzut, Bernd Schumacher, Heinz-Gunter Bach, Petra Spitzer
The dielectric properties of materials are used to describe electrical energy storage, dissipation and energy transfer. The most relevant physical processes in dielectric materials from the practical view point are those which result in power loss

Microwave Characterization of Transparent Conducting Films

May 26, 2011
Author(s)
Jan Obrzut, Oleg A. Kirillov
The high frequency conductivity of thin metallic and graphitic nano-films attracts interest due to many potential applications in spin electronics, electromagnetic shielding, flexible antennas, displays, and solar cells. The surface morphology of thin

Conduction and Loss Mechanisms in Flexible Oxide-Based Memristors

March 21, 2011
Author(s)
Joseph L. Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew A. Herzing, Madelaine H. Hernandez, Christina A. Hacker, Jan Obrzut, Lee J. Richter, Curt A. Richter
In order to study the conduction and loss mechanisms behind their operation, flexible sol-gel based memristors were fabricated with differing oxide film thicknesses and device sizes. XPS, TEM, EELS, and VASE measurements indicated the oxide was amorphous