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Scattering of microwaves in thin metallic films near the metal - non-metal transition

Published

Author(s)

Jan Obrzut

Abstract

We present measurements demonstrating significant scattering of microwaves in a thin metal films near the metal – non-metal percolation transition. Gold films 3 nm to 12 nm thick were characterized using patterned coplanar waveguides over a frequency range of 100 MHz to 20 GHz. Within the percolation coverage of gold nanoparticles when conductivity > 5 x 103 S/cm and the film properties transition from the dielectric to metallic, the microwave transmittance falls far more rapidly than the classical skin depth model would suggest. We observe a frequency-independent absorptance peak of about 50% in that range, which we believe results from an inhomogeneous localization of electromagnetic field, with no characteristic length scale. Our results demonstrate new techniques to study mechanisms of electromagnetic response of randomly structured metallic networks, and suggests the possibility of using surface-enhanced thin films for microwave applications.
Proceedings Title
Proceedings of the 20th IMEKO TC4 International Symposium; Research on Electric and Electronic Measurements for the Economic Upturn
Conference Dates
September 15-17, 2014
Conference Location
Benevento

Keywords

microwave propagation, metal-dielectric transition, nanostructured metallic films, percolation, gold nanoparticles, coplanar waveguides

Citation

Obrzut, J. (2014), Scattering of microwaves in thin metallic films near the metal - non-metal transition, Proceedings of the 20th IMEKO TC4 International Symposium; Research on Electric and Electronic Measurements for the Economic Upturn , Benevento, -1, [online], https://doi.org/10.1021/la401753y (Accessed May 30, 2024)

Issues

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Created September 15, 2014, Updated November 10, 2018