Conductance of thin semicontinuous metallic films is measured in coplanar waveguide configuration at frequencies of 100 MHz to 20 GHz. The presented model of the microwave network correlates the experimental scattering parameters (S11) and (S21) with complex impedance and propagation constant from which we determine the films surface conductance, coefficient of reflectance and transmittance. The measurement is illustrated on films of gold, 4 nm to 12 nm thick, which after percolation from individual nanoparticles resemble a continuous conductor. The presented methodology accurately captures the insulator to conductor transition, and can be used to determine microwave characteristics of such materials.
RF/Microwave Materials Characterization, Proceedings of the 2013 IEEE International Instrumentation and Measurement Technology Conference
May 6-9, 2013
2013 IEEE International Instrumentation and Measurement Technology Conference
microwave conductivity, thin metallic films, conductivity percolation, coplanar waveguides