Microwave Conductance of Semicontinuous Metallic Films from Coplanar Waveguide Scattering Parameters

Published

May 6, 2013

Author(s)

Jan Obrzut, Oleg A. Kirillov

Abstract

Conductance of thin semicontinuous metallic films is measured in coplanar waveguide configuration at frequencies of 100 MHz to 20 GHz. The presented model of the microwave network correlates the experimental scattering parameters (S11) and (S21) with complex impedance and propagation constant from which we determine the films surface conductance, coefficient of reflectance and transmittance. The measurement is illustrated on films of gold, 4 nm to 12 nm thick, which after percolation from individual nanoparticles resemble a continuous conductor. The presented methodology accurately captures the insulator to conductor transition, and can be used to determine microwave characteristics of such materials.

Proceedings Title

RF/Microwave Materials Characterization, Proceedings of the 2013 IEEE International Instrumentation and Measurement Technology Conference

Volume

I2MTC 2013

Conference Dates

May 6-9, 2013

Conference Location

Minneapolis, MN

Conference Title

2013 IEEE International Instrumentation and Measurement Technology Conference

Pub Type

Conferences

Download Paper

https://doi.org/10.1109/I2MTC.2013.6555548

Keywords

microwave conductivity, thin metallic films, conductivity percolation, coplanar waveguides

Citation

Obrzut, J. and Kirillov, O. (2013), Microwave Conductance of Semicontinuous Metallic Films from Coplanar Waveguide Scattering Parameters, RF/Microwave Materials Characterization, Proceedings of the 2013 IEEE International Instrumentation and Measurement Technology Conference, Minneapolis, MN, [online], https://doi.org/10.1109/I2MTC.2013.6555548 (Accessed October 6, 2025)