TY  - CONF
AU  - Jan Obrzut
AU  - Oleg Kirillov
C2  - RF/Microwave Materials Characterization, Proceedings of the 2013 IEEE International Instrumentation and Measurement Technology Conference, Minneapolis, MN
DA  - 2013-05-06
DO  - https://doi.org/10.1109/I2MTC.2013.6555548
LA  - en
M1  - I2MTC 2013
PB  - RF/Microwave Materials Characterization, Proceedings of the 2013 IEEE International Instrumentation and Measurement Technology Conference, Minneapolis, MN
PY  - 2013
TI  - Microwave Conductance of Semicontinuous Metallic Films from Coplanar Waveguide Scattering Parameters
ER  -