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Non-contact Surface Conductance Measurement of Graphene using Resonant Cavity

Published

Author(s)

Jan Obrzut, Oleg A. Kirillov

Abstract

The measurement of conductance by a resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity. The method is applicable to carbon Vapor deposited (CVD) graphene, graphene from silicon carbide (SiC) process, and graphene from reduced graphene oxide. Example measurements are illustrated for single layer and multi-layer CVD graphene deposited on a fused silica substrate. The resonant cavity method is non-contact, fast and accurate with high sensitivity, and thus well suited for standards, research and development (R&D) and for quality control in the manufacturing of nano-carbon materials.
Citation
IEC Technical Committee TC 113

Keywords

Graphene, Surface conductance, Microwave cavity

Citation

Obrzut, J. and Kirillov, O. (2016), Non-contact Surface Conductance Measurement of Graphene using Resonant Cavity, IEC Technical Committee TC 113, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=916692, http://www.iec.ch/tc113 (Accessed August 3, 2021)
Created October 10, 2016, Updated September 14, 2017